Experimental results and modeling techniques for substrate noise in mixed-signal integrated circuits

Modelling of Substrate Noise and Mitigation Schemes for UWB Systems

“…One example is the computationally extensive approach where digital circuit blocks are simulated directly together with an extracted substrate network (4,5). While this approach may lead to accurate results it involves lengthy and time-consuming simulations.…”

“…A lumped element circuit model describing the electrical characteristics of the substrate is also given in the figure. Unlike heavily doped substrates, where the substrate can be treated as a single node, lightly doped bulk substrates have to be modeled using a resistive network representation (4)(5)(6). The Nwell is, however, still modeled as a single node owing to its comparatively higher conductivity than the bulk.…”

“…7.3.1, the switching noise generated by digital circuits can propagate through the substrate to reach sensitive analog/RF circuits and deteriorate their performance. A number of methods have been proposed for achieving an efficient model that is able to capture the main features of the switching noise (4)(5)(6)(7)(12)(13)(14)(15)(16)(17)(18). For heavily doped substrates the substrate is simplified as one electrical node due to their low resistivity, and switching noise modeling methods using this simplification have been proposed (13,14).…”

Dynamic Models for Substrate Coupling in Mixed-Mode Systems

“…When substrate injected currents migrate through the substrate, substrate voltages fluctuate, causing havoc in sensitive analog transistors and possibly leading to malfunctioning circuitry Su et al, 1993;Johnson et al, 1984;Nauta and Hoogzaad, 1997].…”

“…Along with technology miniaturization, die area has shrunk on behalf of package count and production yield purposes. Consequently, different cells and blocks are built closer to each other, in a way that facilitates injected substrate currents to migrate among the substrate layers and reach arbitrarily distant parts of the circuit Su et al, 1993;Verghese, 1995].…”