Experimental Study of the Effect of External Inductance on Pinch Characteristics and Neon Soft X-Ray Yield in Filippov-Type Plasma Focus Device

Mohammadi, M. A.; Manouchehrizadeh, Maryam; Rawat, Rajdeep Singh

doi:10.1134/s1063780x20070077

Cited by 1 publication

(1 citation statement)

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“…Dense Plasma Focus (DPF) devices are pulsed sources of neutrons [1][2][3][4][5], electron beams [6-8], soft x-ray radiation (SXR) [9][10][11][12][13][14][15] and ion beams [16][17][18][19][20][21][22][23]. Column of a pinched plasma in a PF device is believed to typically produce pulsed ions from several of 100 keV to several of MeV (considering ions emitted from the nuclear fusion reactions) [24][25][26][27][28][29].…”

Section: Introductionmentioning

confidence: 99%

Numerical Experiments on Ion-Beam Features Emitted from Different-Energy DPF Devices for Deuterium Gas

Altarabulsi

Abou-Ali

Salo³

et al. 2022

Preprint

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In this study, numerical experiments on ion beam features emitted from nine Dense Plasma Focus devices were carried out using the Lee model code (version RADPFV5.16FIB). A simulation (numerical experiment) and connected fitting procedure of a total discharge current waveform was presented on the example of the PF-24 device, and summary data concerning simulations and fitting procedures for each device were presented. The full details of the ion beam properties as a function of pressure for the PF24 device were presented. The properties of deuterons such as flux, fluence, flux energy, fluence energy, current density, ion current, damage factor, and energy of deuterons versus pressure were computed and investigated. A comparison between the properties of deuterons computed at fitted pressure and at a pressure where the flux is the highest was presented and discussed according to equations on which the Lee model is based.

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