The present work reports surface segregation in polycrystalline yttria-stabilised zirconia (cubic) including 10 mol% Y 2 O 3 (10YSZ). The 10YSZ specimen was annealed in the range 1073 K -1673 K in the gas phase of controlled oxygen activity. The segregation-induced intensity profiles of 89 Y, 40 Ca, 28 Si, 27 Al, 133 Cs, 197 Au and 90 Zr was measured using secondary ion mass spectrometry (SIMS). The data obtained show that (i) annealing of 10YSZ results in the formation of segregation-induced concentration gradients of 89 Y, 40 Ca, 28 Si, 27 Al and (ii) segregation-induced profiles depend on oxygen activity.