“…Such a unique tool has good potential in monitoring void formation behavior and extracting defect information at the atomic scale in structural materials, given that processes at the atomic level are seen to dominate void initiation and evolution. However, tracking rapidly evolving voids in thin specimens has its limitations of temporal and spatial resolution of the cur rent in situ techniques, which necessitates its further development [24]. In addition, the relative thinness of TEM specimens means that any observations occur entirely in the near-surface, defect denuded zone [25].…”