2013
DOI: 10.1016/j.pss.2013.08.022
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Experimental validation of XRF inversion code for Chandrayaan-1

Abstract: We have developed an algorithm (x2abundance) to derive the lunar surface chemistry from X-ray fluorescence (XRF) data for the Chandrayaan-1 Xray Spectrometer (C1XS) experiment. The algorithm converts the observed XRF line fluxes to elemental abundances with uncertainties. We validated the algorithm in the laboratory using high Z elements (20 < Z < 30) published in Athiray et al. (2013). In this paper, we complete the exercise of validation using samples containing low Z elements, which are also analogous to th… Show more

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Cited by 14 publications
(6 citation statements)
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“…The non-destructive elemental techniques described are very useful for meteorite analyses and they have provided important results to understand better the universe and the Earth. However, they present an important drawback since most of them are not very sensitive for light elements [23,46]. Due to this fact, Laser-Induced Breakdown Spectroscopy (LIBS) is becoming a very important tool in the meteorites research field.…”
Section: Elemental Analysesmentioning
confidence: 99%
“…The non-destructive elemental techniques described are very useful for meteorite analyses and they have provided important results to understand better the universe and the Earth. However, they present an important drawback since most of them are not very sensitive for light elements [23,46]. Due to this fact, Laser-Induced Breakdown Spectroscopy (LIBS) is becoming a very important tool in the meteorites research field.…”
Section: Elemental Analysesmentioning
confidence: 99%
“…We developed an XRF inversion code x2abundance to convert the observed X-ray line flux to absolute elemental abundances, where a new approach is adopted using Fundamental Parameter (FP) (Criss & Birks, 1968;Rousseau & Boivin, 1998) by (Athiray et al, 2013a). The algorithm was validated rigorously using laboratory-based XRF experiments on metal alloys and lunar analogous rocks (Athiray et al, 2013b). Dependencies which affect XRF intensities such as the incident spectrum (I o ), matrix effects and geometry effects are all incorporated.…”
Section: Deriving Elemental Abundancesmentioning
confidence: 99%
“…X‐ray fluorescence (XRF) spectrometry is a widely used nondestructive analytical technique for the elemental analysis of materials in various kinds of sample matrices at the micro and trace levels . The technique provides detection sensitivity in the range of few ~ μg/g (ppm) to sub ppm levels for a wide range of elements with atomic numbers (Z) ranging from 14 (Si) to 92 (U) .…”
Section: Introductionmentioning
confidence: 99%