2013 IEEE 31st VLSI Test Symposium (VTS) 2013
DOI: 10.1109/vts.2013.6548879
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Experiments and analysis to characterize logic state retention limitations in 28nm process node

Abstract: Mobile devices spend most of the time in standby mode. Supported features and functionalities are increasing in each newer model. With the wide spread adaptation of multitasking in mobile devices, retaining current status and data for all active tasks is critical for user satisfaction. Extending battery life in portable mobile devices necessitates the use of minimum possible energy in standby mode while retaining present states for all active tasks. This paper for the first time, explains the low voltage data-… Show more

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Cited by 2 publications
(1 citation statement)
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“…Power-gating eliminates the static leakage but with no intention to retain the system state. As mobile devices are required to support many features and functions, resulting in a wide range of multitasking, a minimum delay for the state restoration of all active tasks is critical for user satisfaction [7]. Besides the additional delay, saving and restoring the system state presents additional dynamic power overhead that may not be acceptable for certain common applications.…”
Section: Introductionmentioning
confidence: 99%
“…Power-gating eliminates the static leakage but with no intention to retain the system state. As mobile devices are required to support many features and functions, resulting in a wide range of multitasking, a minimum delay for the state restoration of all active tasks is critical for user satisfaction [7]. Besides the additional delay, saving and restoring the system state presents additional dynamic power overhead that may not be acceptable for certain common applications.…”
Section: Introductionmentioning
confidence: 99%