2021
DOI: 10.1002/aenm.202100804
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Explaining the Fill‐Factor and Photocurrent Losses of Nonfullerene Acceptor‐Based Solar Cells by Probing the Long‐Range Charge Carrier Diffusion and Drift Lengths

Abstract: stability have taken OSC performance to new heights. The emergence of a family of nonfullerene acceptors (NFAs) have delivered a discontinuous advance in cell efficiencies, achieving the efficiency levels of first-generation silicon devices, and with the milestone of 20% now in sight. [1][2][3] Further technological challenges are related to facilitating the manufacturing process, mainly by increasing the active layer thickness, whilst preserving the device performance. [4][5][6] To this end, a straightforward… Show more

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Cited by 32 publications
(45 citation statements)
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References 52 publications
(67 reference statements)
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“…These NFAs are strongly crystalline and exhibit deep highest occupied molecular orbital (HOMO) energy levels, large absorption cross sections in the near-IR region, and optical bandgaps suitable for solar cell applications. Therefore, a lot of studies on Y6-based OSCs have been conducted. In contrast, the excited-state properties of Y6 are still not fully understood. For example, the singlet exciton diffusion length L D , which is defined as L D = ( Dτ ) 0.5 , where D is the exciton diffusion constant and τ is the exciton lifetime, is an important parameter that affects the PCE.…”
Section: Introductionmentioning
confidence: 99%
“…These NFAs are strongly crystalline and exhibit deep highest occupied molecular orbital (HOMO) energy levels, large absorption cross sections in the near-IR region, and optical bandgaps suitable for solar cell applications. Therefore, a lot of studies on Y6-based OSCs have been conducted. In contrast, the excited-state properties of Y6 are still not fully understood. For example, the singlet exciton diffusion length L D , which is defined as L D = ( Dτ ) 0.5 , where D is the exciton diffusion constant and τ is the exciton lifetime, is an important parameter that affects the PCE.…”
Section: Introductionmentioning
confidence: 99%
“…[ 47 ] The parameter θ can be related to the drift length ( l dr ) of carriers driven by the V int under short‐circuit condition, which is expressed by θ = d 2 / l dr 2 . [ 46 ] The l dr of the undoped film is 1.27 × 10 3 nm, which is much higher than the film thickness of 85 nm (Figure 3d). Though either types of doping increase the l dr , the larger l dr from smaller σ in the n‐doped Y6 is more beneficial for the FF improvement.…”
Section: Discussionmentioning
confidence: 88%
“…The FF in OSC has been well related to figure of merits (FoM) θ and α. [ 46–48 ] Bartesaghi et al. proposed the parameter θ as a measure of the ratio of the recombination to extraction rates θ=kreckext=γGd4μnormalnμnormalpVint2 where k rec and k ext are the recombination and extraction rates, γ is the bimolecular recombination coefficient, G is the charge generation rate, d is the film thickness, μ n and μ p are the electron and hole mobilities, and V int is the internal voltage.…”
Section: Discussionmentioning
confidence: 99%
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