1990
DOI: 10.1063/1.103385
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Explanation of low-frequency relative intensity noise in semiconductor lasers

Abstract: For the first time, the enhanced low-frequency relative intensity noise characteristics of semiconductor lasers is explained. It is shown, by multimode rate equation analysis, that the enhanced low-frequency noise is caused by coupling between longitudinal modes which can renormalize the resonance frequency of the individual modes to very low values. It is further shown that a single-mode laser will also exhibit enhanced low-frequency noise unless the side-mode suppression is high.

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Cited by 46 publications
(16 citation statements)
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“…Thus, the short cavity configuration is less sensitive to external perturbations (sound wave, mechanical vibration, and temperature variations) than the long cavity configuration. The peaks among the RIN spectrum of the proposed laser are due to relatively low contrast which is limited mainly by the available pump sources [23].…”
mentioning
confidence: 99%
“…Thus, the short cavity configuration is less sensitive to external perturbations (sound wave, mechanical vibration, and temperature variations) than the long cavity configuration. The peaks among the RIN spectrum of the proposed laser are due to relatively low contrast which is limited mainly by the available pump sources [23].…”
mentioning
confidence: 99%
“…However, we point out that, in practice, the squeezing in the total-intensity noise is limited by other effects, which have been deliberately omitted so far: first, the optical losses inside the cavity, and second, the fact that the perfect anticorrelation between the modes is partially destroyed by various mechanisms, such as self-saturation of each mode 12 or nonlinear gain. 22 When these effects are considered, the calculation shows that the carrier noise picks up some contribution of the large excess noise of the individual modes. However, this contribution remains small in the range of parameters considered in Ref.…”
Section: Appendix B: Phase-amplitude Coupling In Quasi-single-mode Lamentioning
confidence: 99%
“…Reference [SSL90] analyzes on the origin of RIN in semiconductor lasers, while References [Joi92, OS00] provide information on some topics of measurement. In low-noise conditions, |δI/I 0 | ≪ 1, and assuming that the cross-section distribution is constant, the power fluctuations are related to the fractional amplitude noise α by…”
Section: Am Noise In Optical Systemsmentioning
confidence: 99%