2011 Design, Automation &Amp; Test in Europe 2011
DOI: 10.1109/date.2011.5763109
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Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture

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Cited by 39 publications
(14 citation statements)
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“…Finally, a cooperative framework is devised in order to cover also the TPG faults, such that each switch tests the block instances of its neighboring switches. In this scheme, switches exchange test patterns and/or test responses with each other [4].…”
Section: Design Methodsmentioning
confidence: 99%
“…Finally, a cooperative framework is devised in order to cover also the TPG faults, such that each switch tests the block instances of its neighboring switches. In this scheme, switches exchange test patterns and/or test responses with each other [4].…”
Section: Design Methodsmentioning
confidence: 99%
“…In [20] an NoC with a faulty router or a broken link is repaired using spare routers. The inherent structural redundancy of the NoC architecture is exploited in a cooperative way to detect the faults using BIST [21]. Also diagnosis units in switches are utilized to localize a fault.…”
Section: Related Workmentioning
confidence: 99%
“…The concept of exploration/scouting packets [Puente et al 2008] has been employed to identify faulty nodes ahead of regular data packets. Similar to scouting packets, a common method used for fault detection is the broadcasting of test vectors, either during boot-up [Strano et al 2011;Hosseinabady et al 2007] or at runtime. In order to mitigate the performance degradation caused by testing interruptions, token-based mechanisms have been explored [Kakoee et al 2011a[Kakoee et al , 2014 as well as hardware for monitoring specific modules, such as the router arbiters or datapath components [Seitanidis et al 2014].…”
Section: Detection/localizationmentioning
confidence: 99%
“…Traditionally, fault detection is undertaken by Built-In Self-Test (BIST) mechanisms. The BIST process may be executed by the manufacturer prior to shipment, or it may constitute part of system boot-up [Strano et al 2011;Hosseinabady et al 2007]. Runtime BIST is also possible, but system operation is (partially) halted while the module under test is examined [Fick et al 2009b;Kakoee et al 2011a].…”
Section: Introductionmentioning
confidence: 99%