2004
DOI: 10.1145/1028176.1006726
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Exploiting Resonant Behavior to Reduce Inductive Noise

Abstract: Inductive noise in high-performance microprocessors is a reliability issue caused by variations in processor current (di/dt) which are converted to supply-voltage glitches by impedances in the power-supply network. Inductive noise has been addressed by using decoupling capacitors to maintain low impedance in the power supply over a wide range of frequencies. However, even well-designed power supplies exhibit (a few) peaks of high impedance at resonant frequencies caused by RLC resonant loops. Previous archit… Show more

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Cited by 19 publications
(37 citation statements)
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“…They either use lumped PDN models that collapse all pads into a single resistor-inductor pair [8,10,30], or use coarse-grained models that are not able to accurately capture the effect of pad count and location [9]. Fig.…”
Section: Background and Related Workmentioning
confidence: 99%
“…They either use lumped PDN models that collapse all pads into a single resistor-inductor pair [8,10,30], or use coarse-grained models that are not able to accurately capture the effect of pad count and location [9]. Fig.…”
Section: Background and Related Workmentioning
confidence: 99%
“…Several publications [Grochowski et al 2002;Joseph et al 2004;Powell and Vijaykumar 2004] have proposed hardware-based microarchitectural solutions as well as hybrid hardware/software techniques [Hazelwood and Brooks 2004]. Different from the preceding, mentioned work tackling the mid-frequency dI/dt issue (50-100HMz), the focus of this article is to mitigate high-frequency dI/dt that requires immediate response, for which the solutions just mentioned are inappropriate.…”
Section: Related Workmentioning
confidence: 99%
“…Interest in microarchitectural support has grown due to the increasing difficulty of mitigating noise through conventional avenues [18]- [20]. Traditionally, inductive noise could be addressed by reducing effective inductance or adding capacitance on-die or in the package to dampen out the noise.…”
Section: B Modeling Transient Power-related Faultsmentioning
confidence: 99%