2019
DOI: 10.1109/jrfid.2019.2894508
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Exploiting Switching of Transistors in Digital Electronics for RFID Tag Design

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Cited by 11 publications
(1 citation statement)
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“…Measurements of unintended EM emanations are, by their nature of being unintended, extremely weak and susceptible to noise. By applying a strong source frequency to the surface of a DuT and receiving the reflections, a method known as backscattering, the signal to noise ratio (SNR) of the EM side-channel can be improved [10], [24]- [26]. An additional benefit of backscattering for circuit fingerprinting is that the reflected power contains not only modulated circuit activity, but also reflections of characteristic impedances from dormant portions of the DuT.…”
Section: Introductionmentioning
confidence: 99%
“…Measurements of unintended EM emanations are, by their nature of being unintended, extremely weak and susceptible to noise. By applying a strong source frequency to the surface of a DuT and receiving the reflections, a method known as backscattering, the signal to noise ratio (SNR) of the EM side-channel can be improved [10], [24]- [26]. An additional benefit of backscattering for circuit fingerprinting is that the reflected power contains not only modulated circuit activity, but also reflections of characteristic impedances from dormant portions of the DuT.…”
Section: Introductionmentioning
confidence: 99%