Summary
Solid state drives (SSDs) built upon MLC NAND flash memories suffer from a low lifetime endurance induced by continuously scaling‐down feature sizes and increasing bit density per cell. To cost‐effectively address this problem, we propose to integrate both hierarchical data redundancy and heterogeneous flash memory techniques into the SSD, named H2‐SSD. Through deploying across‐chips data redundancy in addition to conventional in‐page error correction codes, error correction capacity, so does the lifetime endurance of H2‐SSD can be dramatically improved. Furthermore, an extra small‐size sisngle‐level cell (SLC) chip is integrated into H2‐SSD to store across‐chips parities. Due to the high program/erase performance and lifetime endurance of that SLC chip, I/O performance degradation induced by the hierarchical data redundancy can be significantly mitigated, even under strict synchronous parity update strategies. Quantitative analysis and trace‐driven simulations are conducted to evaluate the effectiveness and efficiency of H2‐SSD, in both the scenes with and without degraded reads. Experimental results demonstrate that H2‐SSD outperform the conventional SSD in maximum Program/Erase cycles by 23% to 178%, and suffer from negligible degradation of I/O performance in terms of both throughput and average response time in most cases.