2024
DOI: 10.1021/acs.jpcc.4c01124
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Exploration of Deep Learning Models for Accelerated Defect Property Predictions and Device Design of Cubic Semiconductor Crystals

Xiaofeng Xiang,
Dylan Soh,
Scott Dunham

Abstract: In this work, we present an exploration of deep learning models for predicting defect properties in cubic phase semiconductors. The nature of impurity energy levels strongly influences the performance of semiconductors in a wide range of applications, such as solar cells, field effect transistors, and qubits for quantum computing. In this work, we employ two types of deep learning models, a crystal defect graph neural network and a chemical environment-encoded artificial neural network, to predict defect prope… Show more

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