“…In particular, understanding the types and densities of point defects in 2D materials is important for producing 2D materials that can achieve theoretical limits of charge mobility and quantum yield for high quality optoelectronics [1]. Recently, machine learning techniques have been widely applied to electron microscopy data for defect identification, image segmentation, and image denoising [2][3][4][5][6]. Machine learning also opens up new possibilities to analyze large datasets of atomic resolution information.…”