2018
DOI: 10.1587/elex.15.20180475
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Exploring a homotopy approach for the design of nanometer digital circuits tolerant to process variations

Abstract: It is known that process parameter variation degrades the performance of nanometer integrated circuits. Process variations reduce the maximum clock frequency operation of the chips. Diverse strategies have been proposed in the literature to overcome this issue, especially optimization algorithms (gate-sizing algorithms). However, convergence related problems have limited their use. In this work, a homotopy approach for the design of nanometer digital circuits tolerant to process variations is proposed. Two opt… Show more

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