Testing: Academic &Amp; Industrial Conference - Practice and Research Techniques (Taic Part 2008) 2008
DOI: 10.1109/taic-part.2008.16
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Exploring the Relationship of a File's History and Its Fault-Proneness: An Empirical Study

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Cited by 4 publications
(4 citation statements)
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“…For firmware, hot-patching is the ability to patch firmware to a device while maintaining the availability of the system [49]. Finally, Illes-Seifert et al [50] look at hotfixes from a different lens where they consider an update to be a hotfix if it was integrated within the first 5% of time between two consecutive version releases.…”
Section: Domain-specific Definitionmentioning
confidence: 99%
“…For firmware, hot-patching is the ability to patch firmware to a device while maintaining the availability of the system [49]. Finally, Illes-Seifert et al [50] look at hotfixes from a different lens where they consider an update to be a hotfix if it was integrated within the first 5% of time between two consecutive version releases.…”
Section: Domain-specific Definitionmentioning
confidence: 99%
“…Recently, researchers have put more emphasis on process metrics. A considerable process metrics are proposed, mainly including: i) metrics based on code change history, such as number of modified lines [13], [19], [20], [23], [28]- [33], and code relative change metrics [13], [20], [27], [30], ii) metrics based on developer information, such as number of distinct committers [15], [19], [20], [23]- [26], [30], [32], [34], experience of developers [16], [34], commit activities of developers [34], project team organizational structure [17], code ownership [34], and organizational dispersion degree [18], iii) development process related metrics, such as number of revisions [13]- [15], [19], [20], [22], [23], [25], [30], number of defects repaired [30], number of refactorings [20], [30], code change complexity [21], [32], and number of historical defects [19], [23]. The most widely used, classical, and defect-related process metrics are Number of Revisions (NR), Number of Distinct Committers (NDC), Number of Modified Lines (NML), and code relative change metrics.…”
Section: A Process Metricsmentioning
confidence: 99%
“…Graves et al [22] showed that NR was a better predictor of defect, at least better than LOC. Illes-Seifert and Paech [25] compared the correlation between process metrics and the number of defects. The experimental results showed that NR was strongly correlated with the number of defects, and NR had better defect prediction performance.…”
Section: A Process Metricsmentioning
confidence: 99%
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