Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy

Hovden, Robert; Xin, Huolin L.; Muller, David A.

doi:10.1017/s1431927610094171

Cited by 47 publications

(33 citation statements)

References 21 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…In the first method, all of the images in the tilt series can be combined by a wave-packet analysis algorithm into one image with all objects in focus. [81] Therefore, a tilt series of high-resolution images of an extended object with all features in focus is obtained at all viewing angles and reconstructed by traditional means. The dose applied to the sample is higher than a traditional tilt series, and the wave-packet algorithm essentially removes any information about the depth location of the objects.…”

Section: Advances In Et For Physical-sciences Researchmentioning

confidence: 99%

Electron Tomography: A Three‐Dimensional Analytic Tool for Hard and Soft Materials Research

et al. 2015

View full text Add to dashboard Cite

Three-dimensional (3D) structural analysis is essential to understand the relationship between the structure and function of an object. Many analytical techniques, such as X-ray diffraction, neutron spectroscopy, and electron microscopy imaging, are used to provide structural information. Transmission electron microscopy (TEM), one of the most popular analytic tools, has been widely used for structural analysis in both physical and biological sciences for many decades, in which 3D objects are projected into two-dimensional (2D) images. In many cases, 2D-projection images are insufficient to understand the relationship between the 3D structure and the function of nanoscale objects. Electron tomography (ET) is a technique that retrieves 3D structural information from a tilt series of 2D projections, and is gradually becoming a mature technology with sub-nanometer resolution. Distinct methods to overcome sample-based limitations have been separately developed in both physical and biological science, although they share some basic concepts of ET. This review discusses the common basis for 3D characterization, and specifies difficulties and solutions regarding both hard and soft materials research. It is hoped that novel solutions based on current state-of-the-art techniques for advanced applications in hybrid matter systems can be motivated.

show abstract

Section: Advances In Et For Physical-sciences Researchmentioning

confidence: 99%

Electron Tomography: A Three‐Dimensional Analytic Tool for Hard and Soft Materials Research

et al. 2015

View full text Add to dashboard Cite

show abstract

“…Total variation prior. (Rudin et al, 1992;Dey et al, 2004Dey et al, , 2006Hovden et al, 2011;Laasmaa et al, 2011). The TV prior (Rudin et al, 1992) assumes that natural images x should consist of flat regions delineated by a relatively small amount of edges.…”

Section: Bayesian Image Restorationmentioning

confidence: 99%

An overview of state‐of‐the‐art image restoration in electron microscopy

Roels

Aelterman

Luong

et al. 2018

Journal of Microscopy

View full text Add to dashboard Cite

In Life Science research, electron microscopy (EM) is an essential tool for morphological analysis at the subcellular level as it allows for visualization at nanometer resolution. However, electron micrographs contain image degradations such as noise and blur caused by electromagnetic interference, electron counting errors, magnetic lens imperfections, electron diffraction, etc. These imperfections in raw image quality are inevitable and hamper subsequent image analysis and visualization. In an effort to mitigate these artefacts, many electron microscopy image restoration algorithms have been proposed in the last years. Most of these methods rely on generic assumptions on the image or degradations and are therefore outperformed by advanced methods that are based on more accurate models. Ideally, a method will accurately model the specific degradations that fit the physical acquisition settings. In this overview paper, we discuss different electron microscopy image degradation solutions and demonstrate that dedicated artefact regularisation results in higher quality restoration and is applicable through recently developed probabilistic methods.

show abstract

“…Los parches de enfoque son luego mezclados juntos para generar la imagen final con la mayoría o en su totalidad en foco. Algunos autores [9] han empleado una variedad de enfoques algorítmicos para compaginar fotografías de microscopía óptica, y entre los más avanzados obtener un mapa de la topografía superficial. Cabe destacar que para realizar el stacking es necesario obtener imágenes con el menor salto posible en el eje Z, además de poder medir con exactitud el desplazamiento del microscopio.…”

Section: Figuraunclassified

Metodología ad hoc para la observación de superficies de desgaste y fractura

et al. 2018

View full text Add to dashboard Cite

RESUMENEn el presente trabajo, se presenta una metodología de análisis y medición microscópica de superficies de desgaste, a partir de imágenes confeccionadas con técnicas de procesamientos digitales tipo stitching y stacking. Las imágenes se obtienen a partir de un sistema de observación microscópico ad-hoc y de bajo costo, compuesto por módulos de posicionamiento de muestras y enfoque-elevación con resolución micrométrica.El objetivo del trabajo es reunir la mayor cantidad de información en una única imagen. La creación de documentación fotográfica permanentes tiene la ventaja de analizar una superficie sin peligro de manipular una muestra.Se observó que la metodología utilizada ha sido satisfactoria para la determinación de características superficiales y mediciones para cálculo de tasa de desgaste en ensayos block on ring, como también para algunos análisis de fractura.Palabras clave: microscopía, stitching, stacking, superficies, desgaste. ABSTRACTIn the present work, a methodology of microscopic analysis and measurement of wear surfaces is presented, based on images made using digital processing techniques such as stitching and stac-king. The images are obtained from an ad-hoc and low-cost microscopic observation system, consisting of sample positioning and focus-elevation modules with micrometric resolution. The objective of the work is to gather as much information in a single image. The creation of permanent photographic documentation has the advantage of analyzing a surface without danger of manipulating a sample.It was observed that the methodology used was satisfactory for the determination of surface characteristics and measurements for calculation of wear rate in block on ring tests, as well as for some fracture analysis.

show abstract

Extended Depth of Field for High-Resolution Scanning Transmission Electron Microscopy

Cited by 47 publications

References 21 publications

Electron Tomography: A Three‐Dimensional Analytic Tool for Hard and Soft Materials Research

Electron Tomography: A Three‐Dimensional Analytic Tool for Hard and Soft Materials Research

An overview of state‐of‐the‐art image restoration in electron microscopy

Metodología ad hoc para la observación de superficies de desgaste y fractura

Contact Info

Product

Resources

About