2019
DOI: 10.1021/acsami.9b14584
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Extending the Range of Controlling Protein Adsorption via Subsurface Architecture

Abstract: Extending the range of controlling protein adsorption via subsurface architecture. ACS Applied Materials and Interfaces.

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Cited by 7 publications
(17 citation statements)
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References 69 publications
(197 reference statements)
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“…Reducing the oxygen partial pressure and ion bombardment (by power and pressure variation), the deposition of less dense SiOx PPFs have been thoroughly studied in previous work using O 2 /HMDSO of 40/4 sccm (100 W, 7 Pa, with 20 sccm Ar admixture). [15,20] Ar admixture supports fragmentation, oxidation, and deposition of less dense SiOx at moderate ion bombardment conditions. [54] Such films have a specific density of 1.9 ± 0.1 g cm −3 with a chemical composition of SiO 1.9-2.0 C 0.4-0.5 indicating residual hydrocarbons.…”
Section: Selection Of Process Parametersmentioning
confidence: 96%
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“…Reducing the oxygen partial pressure and ion bombardment (by power and pressure variation), the deposition of less dense SiOx PPFs have been thoroughly studied in previous work using O 2 /HMDSO of 40/4 sccm (100 W, 7 Pa, with 20 sccm Ar admixture). [15,20] Ar admixture supports fragmentation, oxidation, and deposition of less dense SiOx at moderate ion bombardment conditions. [54] Such films have a specific density of 1.9 ± 0.1 g cm −3 with a chemical composition of SiO 1.9-2.0 C 0.4-0.5 indicating residual hydrocarbons.…”
Section: Selection Of Process Parametersmentioning
confidence: 96%
“…Therefore, O 2 /Ar plasma etching (40/20 sccm, 100 W, 7 Pa) has previously been introduced to increase porosity after depositing the SiOx film as before. [15] The hydrocarbon etching resulted in chemical composition of SiO 2.2 with low, negligible carbon content indicating the incorporation of up to 10% Si-OH ([SiO 2 ] 0.9 •[Si (OH) 4 ] 0.1 ). The film density was reduced to 1.7 ± 0.1 g cm −3 after plasma etching.…”
Section: Selection Of Process Parametersmentioning
confidence: 99%
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“…The 4-nm hydrophobic cover layer was deposited by plasma-enhanced chemical vapor deposition following an established protocol (10 s, Ar/HMDSO 20/4 sccm, 50 W, 7 Pa). [33][34][35] All plasma process steps were performed at low temperature (<70°C), thus allowing treatment of sensitive materials, such as polymers, textiles, nonwovens, or scaffolds.…”
Section: Plasma Processingmentioning
confidence: 99%