2008 IEEE Silicon Nanoelectronics Workshop 2008
DOI: 10.1109/snw.2008.5418483
|View full text |Cite
|
Sign up to set email alerts
|

Extraction of RF parameters in planar channel MOSFETs through RF device modeling

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 1 publication
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?