2002
DOI: 10.1016/s0304-8853(01)01207-0
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Extraordinary Hall effect in magnetic films

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Cited by 60 publications
(31 citation statements)
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“…The current sensitivity S I is about 0.9 V / AT in the linear region ͑i.e., below 1 T͒. Since the device thickness is about 50 nm, this corresponds to a Hall coefficient R H of about 5 ϫ 10 −8 ⍀ m/T ͑similar to that reported for Fe-Pt, Fe-Si, Ni, and LaBaMnO 3 thin films, [10][11][12][13][14][15] and Fe-Cr multilayers 16 ͒. The resistance between the bias current contacts varies by less than 0.5% from 0 to 2.2 T. At magnetic inductions higher than 1 T, the Hall voltage saturates ͑above 1 T the Hall voltage varies by only a few microvolts͒.…”
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confidence: 98%
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“…The current sensitivity S I is about 0.9 V / AT in the linear region ͑i.e., below 1 T͒. Since the device thickness is about 50 nm, this corresponds to a Hall coefficient R H of about 5 ϫ 10 −8 ⍀ m/T ͑similar to that reported for Fe-Pt, Fe-Si, Ni, and LaBaMnO 3 thin films, [10][11][12][13][14][15] and Fe-Cr multilayers 16 ͒. The resistance between the bias current contacts varies by less than 0.5% from 0 to 2.2 T. At magnetic inductions higher than 1 T, the Hall voltage saturates ͑above 1 T the Hall voltage varies by only a few microvolts͒.…”
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confidence: 98%
“…5 Magnetic materials show additional "Hall phenomena" which are, generally speaking, generated by spin-orbit interactions: the so-called extraordinary [10][11][12][13][14][15][16] and planar Hall effects.…”
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“…R OH is found from measuring V H in fields beyond the sample's magnetic saturation, and can then be used to subtract the term linear in B Z from Eq. (1), producing a signal directly proportional to the sample's magnetization M Z :The technique was shown [12,13] Results and discussion I. Cumulative minor loops where M s is the saturated magnetization, V EHE is extracted by using Eq.…”
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“…A probable reason for this is that although EHE in bulk magnetic materials can be significantly higher than the ordinary Hall effect in normal metals, its magnitude remained far beyond the sensitivity of semiconductors and magnetic sensors based on the anisotropic magnetoresistance [12]. The renewed interest in EHE has only recently arisen when some recipes to enhance the effect were found [13][14][15].The Hall effect in magnetic materials is commonly described [8,16] by the phenomenological equationwhere ρ H is the Hall resistivity, B, H and M are components of the magnetic induction, applied field and magnetization normal to the film plane, and D is the demagnetization factor. R 0 is the ordinary Hall coefficient related to the Lorentz force acting on moving charge carriers.…”
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confidence: 99%