2012
DOI: 10.2478/s11534-012-0015-1
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Extraordinary magnetoresistance: sensing the future

Abstract: Abstract:Simulations utilising the finite element method (FEM) have been produced in order to investigate aspects of circular extraordinary magnetoresistance (EMR) devices. The effect of three specific features on the resultant magnetoresistance were investigated: the ratio of the metallic to semiconducting conductivities (σ M /σ S ); the semiconductor mobility; and the introduction of an intermediate region at the semiconductormetal interface in order to simulate a contact resistance. In order to obtain a lar… Show more

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Cited by 11 publications
(14 citation statements)
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“…The extraordinary magnetoresistance (EMR) effect discovered by Solin and coworkers led to widespread interest in this phenomenon for magnetic sensing applications [1][2][3][4] . In the original work 1 , an extremely large magnetoresistance was found with the normalized ratio M R = (R(B) − R 0 ) /R 0 as high as 16,000 5 at B = 5 T, in devices comprised of a four-terminal InSb disk with a central metal shunt.…”
mentioning
confidence: 99%
“…The extraordinary magnetoresistance (EMR) effect discovered by Solin and coworkers led to widespread interest in this phenomenon for magnetic sensing applications [1][2][3][4] . In the original work 1 , an extremely large magnetoresistance was found with the normalized ratio M R = (R(B) − R 0 ) /R 0 as high as 16,000 5 at B = 5 T, in devices comprised of a four-terminal InSb disk with a central metal shunt.…”
mentioning
confidence: 99%
“…See Refs. [ 27 , 28 ] for detailed discussions on these issues. Note that here we observe slight negative magnetoresistances, see Figure 3 a.…”
Section: Resultsmentioning
confidence: 99%
“…When the highest carrier densities are used in the four geometries, we observe the common feature of a very low device resistance that is only weakly dependent on the magnetic field. In this case, the conductivity of the semiconductor is similar to or even exceeds that of the metal, and as the conductivity contrast across the metal/semiconductor interface becomes small, its capability to deflect the current path in magnetic fields vanishes [13]. Hence, the EMR effect is suppressed for all geometries.…”
Section: Carrier Densitymentioning
confidence: 99%
“…Previous studies have explored the role of material properties by varying them with the use of finite element simulations and have found that achieving a high magnetoresistance generally requires a high electron mobility in the semiconductor, high electrical conductivity of the metal, as well as a low contact resistance between the two material regions [10,12,13]. In particular, for the benchmark concentric circular geometry, it was found that increasing the mobility from 500 to 200 000 cm 2 Vs −1 increased the magnetoresistance at 1 T by three orders of magnitude, whereas the magnetoresistance completely vanished for high semiconductor/metal contact resistances [13]. The material requirements sparked an interest in studying the behavior of EMR in various high-mobility materials, including InSb [8,[12][13][14][15][16][17], InAs [18][19][20], GaAs [21][22][23][24] and graphene [25][26][27][28][29][30].…”
Section: Introductionmentioning
confidence: 99%