“…SEEs are a serious problem for electronics operated in space (e.g., Edmonds, Barnes, and Scheick, 2000—a JPL publication; O'Bryan et al, ; Xapsos et al, ), and they are becoming an issue for advanced technologies in avionics (e. g., Dyer & Truscott, ; Dyer et al, ), and even at sea level. The charge deposited by a single ionizing particle (producing a dense track of electron‐hole pairs in devices, circuits, and components) can produce a wide range of effects, including single‐event upset (transient and nondestructive, affecting mainly memories), multiple bit upset (nondestructive), single‐event transient (nondestructive), single‐event functional interrupt (nondestructive), single‐event latch‐up (destructive, affecting mainly complementary metal‐oxide‐semiconductor structure), single‐event burnout (destructive; affecting mainly power metal‐oxide‐semiconductor field‐effect transistors), single‐event gate rupture (potentially destructive, affecting mainly submicronic structure), and single hard error (another destructive effect).…”