Extreme ultraviolet absorption and band density of NiO

Brown, F. C.; Gähwiller, Christian; Kunz, A. Barry

doi:10.1016/0038-1098(71)90327-9

Cited by 49 publications

(3 citation statements)

References 8 publications

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“…1) was recorded by monitoring the sample drain current and by normalizing to the reference current taken from a gold mesh. The measured XAS is in good agreement with the previously reported data [22,23]. The two main features with maxima around 66.7 and 70.0 eV are atomic multiplet rather than spin-orbit split peaks [24].…”

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Localized Electronic Excitations in NiO Studied with Resonant Inelastic X-Ray Scattering at the NiMThreshold: Evidence of Spin Flip

et al. 2005

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We studied the neutral electronic excitations of NiO localized at the Ni sites by measuring the resonant inelastic x-ray scattering (RIXS) spectra at the Ni M2,3 edges. The good energy resolution allows an unambiguous identification of several spectral features due to excitations. The dependence of the RIXS spectra on the excitation energy gives evidence of local spin flip and yields a value of 125 +/- 15 meV for the antiferromagnetic exchange interaction. Accurate crystal field parameters are also obtained.

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Localized Electronic Excitations in NiO Studied with Resonant Inelastic X-Ray Scattering at the NiMThreshold: Evidence of Spin Flip

et al. 2005

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“…7, and the loss-deconvoluted W͑E͒, Fig. 38 Their second peak occurred about 2 eV higher ͑in photon absorption͒ energy than their initial peak. The change in shape for the W͑E͒ signal, from a single-to a double-peak near threshold, is similar to that found for the Ni͑3p͒-SXAS transitions.…”

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“…38 In a thorough discussion of theoretical models used in interpreting the electronic structure of various transition metal oxides, Cox 39 notes that no model has been universally accepted. 38 In a thorough discussion of theoretical models used in interpreting the electronic structure of various transition metal oxides, Cox 39 notes that no model has been universally accepted.…”

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confidence: 99%

Oxygen-induced changes in electron-energy-loss spectra for Al, Be and Ni

Madden

Landers

Kleiman

et al. 1999

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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Articles you may be interested inComprehensive studies of the electronic structure of pristine and potassium doped chrysene investigated by electron energy-loss spectroscopy Electron energy loss spectroscopy of ZnO nanocrystals with different oxygen vacancy concentrations J. Appl. Phys. 109, 063523 (2011); 10.1063/1.3555604Electronic properties of ultrathin Hf O 2 , Al 2 O 3 , and Hf-Al-O dielectric films on Si(100) studied by quantitative analysis of reflection electron energy loss spectra Molecularly chemisorbed intermediates to oxygen adsorption on Pt(111): A molecular beam and electron energyloss spectroscopy study Electron-energy-loss spectroscopy ͑EELS͒ data are presented to illustrate line shape changes that occur as a result of oxygen interaction with metal surfaces. The metals were aluminum, beryllium and nickel. Core-level EELS data were taken for excitations from Al͑2p͒, Be͑1s͒, Ni͑3p/3s͒ and O͑1s͒ levels to the conduction band ͑CB͒ density of states ͑DOS͒ of the materials. The primary beam energies for the spectra were 300, 450, 300, and 1135 eV, respectively. The data are presented in both the ͑as measured͒ first-derivative and the integral forms. The integral spectra were corrected for coherent background losses and analyzed for CB DOS information. These spectra were found to be in qualitative agreement with published experimental and theoretical studies of these materials. One peak in the spectra for Al oxide is analyzed for its correlation with excitonic screening of the Al͑2p͒ core hole. Similar evidence for exciton formation is found in the Ni͑3p͒ spectra for Ni oxide. Data are also presented showing oxygen-induced changes in the lower-loss-energy EELS curves that, in the pure metal, are dominated by plasmon-loss and interband-transition signals. Single-scattering loss profiles in the integral form of the data were calculated using a procedure of Tougaard and Chorkendorff ͓S. Tougaard and I. Chorkendorff, Phys. Rev. B. 35, 6570 ͑1987͔͒. For all three oxides these profiles are dominated by a feature with a loss energy of around 20-25 eV. Although this feature has been ascribed by other researchers as due to bulk plasmon losses in the oxide, an alternative explanation is that the feature is simply due to O͑2s͒-to-CB-level excitations. An even stronger feature is found at 7 eV loss energy for Ni oxide. Speculation is given as to its source. The line shapes in both the core-level and noncore-level spectra can also be used simply as ''fingerprints'' of the surface chemistry of the materials. Our data were taken using commercially available surface analysis equipment and serve to complement surface information provided by Auger electron and/or x-ray photoelectron spectroscopy.

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Soft X‐Ray Absorption in CuNi Alloys

Gudat

Kunz

1972

Physica Status Solidi (b)

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Cu-Ni alloy films have been investigated in the vicinity of the onset of 3p electron absorption in the photon energy range 50 to 90 eV. The spectra obtained can be described as a stoichiometric superposition of the individual Cu and Ni metal spectra. Any rearrangement of the states due to an alloy interaction is of no great influence. This result is in general agreement with results on soft X-ray emission, uv and X-ray photoelectric emission. It is in contradiction to the rigid band model and supports more recent alloy theories such as the coherent-potential approximation. This result, moreover, supports the interpretation of the wide structures in the transition metal spectra as a predominantly atomic effect.Dunne Schichten einer Cu-Ni-Legierung wurden in der Umgebung der Absorption der 3p-Elektronen im Photonenenergiebereich 50 bis 90 eV untersucht. Die Spektren konnen als stochiometrische Superposition der Spektren von Cu und Ni beschrieben werden. Veranderungen der ZustLnde durch die Legierungsbildung sind ohne merklichen EinfluB. Dieses Ergebnis zeigt die gleiche Tendenz wie Rontgenemissionsmessungen im weichen Rontgengebiet und Photoelektronenuntersuchungen im UV-und Rontgengebiet. Es steht im Widerspruch zum ,,rigid-band-model" und unterstiitzt neuere Theorien wie die ,,coherentpotential approximation". Dariiber hinaus spricht dieses Ergebnis fur eine atomare Deutung der breiten Maxima in den Spektren der ubergangsmetalle.

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Extreme ultraviolet absorption and band density of NiO

Cited by 49 publications

References 8 publications

Localized Electronic Excitations in NiO Studied with Resonant Inelastic X-Ray Scattering at the NiMThreshold: Evidence of Spin Flip

Localized Electronic Excitations in NiO Studied with Resonant Inelastic X-Ray Scattering at the NiMThreshold: Evidence of Spin Flip

Oxygen-induced changes in electron-energy-loss spectra for Al, Be and Ni

Soft X‐Ray Absorption in CuNi Alloys

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