2007
DOI: 10.1154/1.2754462
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F-7 Minimal Use of Standards for Quantifying Trace Elements in Plastics

Abstract: The minimum requirements for standards when quantifying trace elements in plastics by X-ray fluorescence (XRF) have been investigated. The fundamental parameters method, backed up by one or more standards, is used to translate XRF intensities into quantitative information about trace element concentrations. The method includes accounting for variations in sample thickness using scattered radiation. Of course, the method works best if the standards contain certified values of all of the trace elements of intere… Show more

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“…The samples were pressed into pellets [51,54], collected onto membrane filter or Mylar [53], or analyzed as powders [50]. Elam and coworkers [55,56] determined RoHS elements (Restriction of Hazardous Substances Directive adopted by the European Union) in plastics by means of FP method using scattered radiation for compensation of thickness variations. Elements such as Cl, Cr, Hg, Pb, Br, Cd and Se were quantified in polyethylene, polyvinyl chloride, polyester of various loadings and thicknesses (from 4 to 14 mm).…”
Section: Backscattered Fundamental Parameters Methodsmentioning
confidence: 99%
“…The samples were pressed into pellets [51,54], collected onto membrane filter or Mylar [53], or analyzed as powders [50]. Elam and coworkers [55,56] determined RoHS elements (Restriction of Hazardous Substances Directive adopted by the European Union) in plastics by means of FP method using scattered radiation for compensation of thickness variations. Elements such as Cl, Cr, Hg, Pb, Br, Cd and Se were quantified in polyethylene, polyvinyl chloride, polyester of various loadings and thicknesses (from 4 to 14 mm).…”
Section: Backscattered Fundamental Parameters Methodsmentioning
confidence: 99%