“…While some of these studies distinguish the images as defected/un-defected, some perform classification according to defect types. Gabor wavelets, [14][15][16] PCA, 14,15 independent component analysis (ICA), 17 the local binary pattern (LBP), 18,19 the gray level co-occurrence matrix (GLCM), 18,19 support vector machines (SVMs), [19][20][21][22][23] and k-nearest neighbors (KNN) 21,22 are used in the majority of fabric defect detection studies. The methods of the histogram, cooccurrence matrix, and shape descriptor are used for feature extraction, while the SVM is used for classification in the study of Murino et al 20 Images are divided into sub-windows in the study of Basibuyuk et al 24 Autoregressive coefficients are calculated using randomly selected un-defected images.…”