Abstract:Si-doped diamond films are deposited on cobalt cemented tungsten carbide (WC-Co) welding dies using hot filament chemical vapor deposition (HFCVD) method, where tetraethoxysilane (C8H20O4Si) is introduced in the reactive chamber as silicon source by bubbling method. Filed emission scanning electron microscope (FESEM) and Raman spectroscopy are used to characterize the as-deposited diamond films. The results show that silicon doping can reduce the diamond crystal size and residual stress of diamond films, and a… Show more
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