2021
DOI: 10.1016/j.ceramint.2021.05.161
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Fabrication and function examination of PZT-based MEMS accelerometers

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Cited by 18 publications
(7 citation statements)
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“…In Eq (10), a e is the electrothermal noise density (unit: µg/√Hz) at a certain frequency; k b is the Boltzmann constant; T is the temperature in Kelvin; η is the loss factor, which is 0.02 for PVDF 29 ; ω is the angular frequency (unit: Rad/s) of the input acceleration; and Q is the charge sensitivity (unit: pC/g). Using the square of Eq.…”
Section: Device-level Noise Measurement and Analysismentioning
confidence: 99%
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“…In Eq (10), a e is the electrothermal noise density (unit: µg/√Hz) at a certain frequency; k b is the Boltzmann constant; T is the temperature in Kelvin; η is the loss factor, which is 0.02 for PVDF 29 ; ω is the angular frequency (unit: Rad/s) of the input acceleration; and Q is the charge sensitivity (unit: pC/g). Using the square of Eq.…”
Section: Device-level Noise Measurement and Analysismentioning
confidence: 99%
“…Moreover, PZT has a 100 times higher dielectric constant than PVDF 4,27 , leading to more significant thermoelectrical noise, as per Eq. (10). As shown in Table 2, the tradeoff for the lower noise in piezoelectric MEMS accelerometers is a reduced bandwidth.…”
Section: Also Used Cantilever-basedmentioning
confidence: 99%
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“…The results indicated that a higher voltage output can be achieved with a smaller filling and electrode interspace. Recently, in 2021, Lee et al [ 23 ] proposed and fabricated a piezoelectric MEMS accelerometer on Si substrates using photolithography and sol-gel PNZT. The accelerometer exhibited a sensitivity of 16.8 mV/g at 200 Hz.…”
Section: Introductionmentioning
confidence: 99%