2010
DOI: 10.1016/j.radmeas.2009.12.025
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Fabrication and imaging characterization of high sensitive CsI(Tl) and Gd2O2S(Tb) scintillator screens for X-ray imaging detectors

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Cited by 56 publications
(36 citation statements)
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“…[5]. In this work, the synthesized Gd 2 O 3 (Eu) powder was also calcinated at various Eu 3 þ doping concentrations of 1-10 mol% and heat-treatment time of 1-10 h. For X-ray imaging detector applications with synthesized nanocrystalline Gd 2 O 3 (Eu) scintillating screen, uniform screens with several mm thickness were fabricated by mixing and thermal hardening of powder, dispersion agent and other organic additives through screen printing method [6]. The microstructures such as particle sizes, morphology of synthesized Gd 2 O 3 :Eu scintillator with various calcination time and Eu 3 þ concentration were investigated by FE-SEM (JEM-2100F HR) and the existing phase of the synthesized Gd 2 O 3 :Eu with various calcination times and doped Eu 3 þ concentration were performed by high resolution X-ray diffraction(Ultima IV, RIGAKU) with an analysis range 2y of 20-901 respectively.…”
Section: Methodsmentioning
confidence: 99%
“…[5]. In this work, the synthesized Gd 2 O 3 (Eu) powder was also calcinated at various Eu 3 þ doping concentrations of 1-10 mol% and heat-treatment time of 1-10 h. For X-ray imaging detector applications with synthesized nanocrystalline Gd 2 O 3 (Eu) scintillating screen, uniform screens with several mm thickness were fabricated by mixing and thermal hardening of powder, dispersion agent and other organic additives through screen printing method [6]. The microstructures such as particle sizes, morphology of synthesized Gd 2 O 3 :Eu scintillator with various calcination time and Eu 3 þ concentration were investigated by FE-SEM (JEM-2100F HR) and the existing phase of the synthesized Gd 2 O 3 :Eu with various calcination times and doped Eu 3 þ concentration were performed by high resolution X-ray diffraction(Ultima IV, RIGAKU) with an analysis range 2y of 20-901 respectively.…”
Section: Methodsmentioning
confidence: 99%
“…The spatial resolution (MTF) and x-ray images of a memory chip were obtained using the CCD camera system. The MTF curve was measured as a function of spatial frequency of the fabricated CsI:Tl film by capturing edge images using a tungsten phantom of thickness 1 mm [10].…”
Section: Measurement Of Scintillation Characteristicsmentioning
confidence: 99%
“…also studied the fabrication of CsI:Tl scintillator on substrate and reflective layers [10], but their results were limited by optical loss due to the substrate located between the CsI:Tl scintillator and detector.…”
Section: Measurement Of Spatial Resolution and X-ray Imagesmentioning
confidence: 99%
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“…The scintillating screens needs to fulfill characteristics, such as high density and high atomic number, to ensure efficient stopping power of ionizing radiation, but also high luminescence efficiency and low afterglow to ensure good energy resolution. The most traditionally used commercial scintillating materials are thallium doped cesium iodide (CsI:Tl), due to its good spatial resolution properties arising from columnar structure and terbium-doped gadolinium oxysulphide (Gd 2 O 2 S:Tb) due to its high X-ray absorption and light conversion efficiency [1][2][3][4]. Furthermore many scintillators have been investigated for X-ray imaging applications, such as Gd 2 O 2 S:Eu, Gd 2 O 2 S:Pr,Ce,F, Lu 2 O 3 :Eu, Gd 2 O 2 S:Pr employed in granular phosphors screens, and LuPO 4 :Eu semitransparent thin films [5][6][7][8][9].…”
Section: Introductionmentioning
confidence: 99%