Fabrication and optical characterization of Bragg resonance luminescence porous silicon

Park, Mi-Ae; Sohn, Honglae

doi:10.1088/0268-1242/31/1/014013

Cited by 6 publications

(3 citation statements)

References 23 publications

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“…Here a shift to shorter wavelengths can be observed in all the experimental spectra which suggests that the SE refractive indices are not adequate. The calculations of the Q e -factor for these mirrors confirm the inadequacy of the SE measurements (see tables[1][2][3]. The difference between theory and experiment can be understood as a result of the complexity of modelling the PS nanostructure and the use of accurate SE data with complex models to estimate refractive indeces which afterwards are used in simple photonic structures.The blue-shift of the experimental reflectance spectra in figure4advises that the refractive index values must be smaller in order to displace the spectra to larger wavelengths to fit the theoretical spectra.…”

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confidence: 68%

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Refractive index evaluation of porous silicon using Bragg reflectors

Estrada‐Wiese¹,

Río²

2018

Rev. Mex. Fís.

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There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of the thickness periodicity and the refractive index of their components. Porous silicon (PS) is a nano-structured material widely used 1 to prepare 1D photonic crystals due to the ease of tuning its porosity and its refractive index by changing the fabrication conditions. Since the morphology of PS changes with porosity, the determination of PS's refractive index is no easy task. To find the optical properties of PS we can use different effective medium approximations (EMA).In this work we propose a method to evaluate the performance of the refractive index of PS layers to build photonic Bragg reflectors.Through a quality factor we measure the agreement between theory and experiment and therein propose a simple procedure to determine the usability of the refractive indices. We test the obtained refractive indices in more complicated structures, such as a broadband Vis-NIR mirror, and by means of a Merit function we find a good agreement between theory and experiment. With this study we have proposed quantitative parameters to evaluate the refractive index for PS Bragg reflectors. This procedure could have an impact on the design and fabrication of 1D photonic structures for different applications.

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confidence: 68%

“…For example, a Bragg-reflector is composed of a periodic stack of layers which alternate between high and low refractive indices with a high contrast between layers. If each layer satisfies the quarter wavelength condition, a selective mirror that reflects a central wavelength can be constructed [3,4,5,6].…”

Section: Introductionmentioning

confidence: 99%

Refractive index evaluation of porous silicon using Bragg reflectors

Estrada‐Wiese¹,

Río²

2018

Rev. Mex. Fís.

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“…It was reported in the literature that increasing radiative recombination via direct band-gap transitions and reducing the phonon-assisted indirect band-gap transitions can significantly enhance the photoluminescence [ 13 ]. Previous studies led by our group have demonstrated the successful fabrication of the DBR multilayer porous silicon devices exhibiting sharp PL peaks that arise from Bragg resonance in the visible range [ 14 ]. DBR devices are fabricated by alternating the square wave current between the high and low current values, leading to layers with low and high refractive indices, respectively.…”

Section: Introductionmentioning

confidence: 99%

A Novel Chemical Gas Vapor Sensor Based on Photoluminescence Enhancement of Rugate Porous Silicon Filters

Zhou

Sohn

2020

Sensors

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In this study, an innovative rugate filter configuration porous silicon (PSi) with enhanced photoluminescence intensity was fabricated. The fabricated PSi exhibited dual optical properties with both sharp optical reflectivity and sharp photoluminescence (PL), and it was developed for use in organic vapor sensing. When the wavelength of the resonance peak from the rugate PSi filters is engineered to overlap with the emission band of the PL from the PSi quantum dots, the PL intensity is amplified, thus reducing the full width at half maximum (FWHM) of the PL band from 154 nm to 22 nm. The rugate PSi filters samples were fabricated by electrochemical etching of highly doped n-type silicon under illumination. The etching solution consisted of a 1:1 volume mixture of 48% hydrofluoric acid and absolute ethanol and photoluminescent rugate PSi filter was fabricated by etching while using a periodic sinusoidal wave current with 10 cycles. The obtained samples were characterized by scanning electron microscopy (SEM), and both reflection redshift and PL quenching were measured under exposure to organic vapors. The reflection redshift and PL quenching were both affected by the vapor pressure and dipole moment of the organic species.

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Optical Characterization of Transmitted Visible Photoluminescence of Bragg‐resonanced Porous Silicon

Park

Cho

Sohn

2018

Bulletin Korean Chem Soc

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The investigation and optical characterization of Bragg resonance luminescence porous silicon (BRL PS) exhibiting both optical reflectivity and sharp photoluminescence (PL) at the Bragg resonance wavelength were reported. Two types of Bragg reflector porous silicon (BR PS) samples which exhibit strong reflection in visible or near infrared region and broad red PL were fabricated. When the Bragg reflection wavelength places in the range of emission wavelength, BR PS starts to exhibit narrowing of PL behavior. The optimization of Bragg resonance phenomenon of PL to generate sharp Bragg‐resonated PL by changing the number of repeats of Bragg‐stack layers. BR PS showing the reflection wavelength of 640 nm with 50 repeats exhibited sharp PL at the Bragg resonance wavelength with broad weak PL. BRL PS having 70% porosity with 1.45 refractive index displayed the second‐order reflectivity peak at 640 nm, thus sharp PL peak at 640 nm was the second‐order transmitted and amplified PL peak at the Bragg resonance wavelength. The optical properties of free‐standing BR PS film were investigated. The front side surface of BR PS shows both reflectivity and PL, however the back side surface of free‐standing BR PS shows only reflectivity without PL.

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Fabrication and optical characterization of Bragg resonance luminescence porous silicon

Cited by 6 publications

References 23 publications

Refractive index evaluation of porous silicon using Bragg reflectors

Refractive index evaluation of porous silicon using Bragg reflectors

A Novel Chemical Gas Vapor Sensor Based on Photoluminescence Enhancement of Rugate Porous Silicon Filters

Optical Characterization of Transmitted Visible Photoluminescence of Bragg‐resonanced Porous Silicon

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