2008
DOI: 10.1016/j.jallcom.2006.12.020
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Fabrication and optical constants of amorphous copper nitride thin films prepared by ion beam assisted dc magnetron reactive sputtering

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Cited by 27 publications
(8 citation statements)
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“…The optical band gap E g is another important quantity that characterizes semiconductors and dielectric materials because it has a considerable significance in the design and modeling of such materials . The optical band gap was derived from the intercept of the extrapolated liner part of the plot of (α E ) p versus the photon energy E with abscissa.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…The optical band gap E g is another important quantity that characterizes semiconductors and dielectric materials because it has a considerable significance in the design and modeling of such materials . The optical band gap was derived from the intercept of the extrapolated liner part of the plot of (α E ) p versus the photon energy E with abscissa.…”
Section: Optical Propertiesmentioning
confidence: 99%
“…Cu 3 N has been obtained by a variety of methods including sputtering, , molecular beam epitaxy, atomic layer deposition, , and pulsed laser deposition. , Recently, Matsuzaki et al have obtained Cu 3 N from Cu under NH 3 and O 2 between 500 and 800 °C. However, in the past, most have obtained Cu 3 N by sputtering of Cu under N 2 in conjunction with Ar, which enables control over its stoichiometry.…”
Section: Introductionmentioning
confidence: 99%
“…Some spread is apparent in various physical properties reported for Cu 3 N, as illustrated by the lattice parameter and band gap which range from 3.807(4) [14] through 3.89Å [15] and 0.25 to 1.9 eV [16], respectively. Such variability is thought to result from differences in nitrogen content, which may vary at growth time due to nitrogen liberation [16] and is implicated in affecting the stoichiometry [17], band gap [18], native acceptor concentration [19], conductivity [20], preferential orientation [17] and decomposition temperature [16]. Stoichiometric, copper-, or nitrogen-rich films may all be prepared, with excess copper or nitrogen atoms likely incorporated in the body-center position or at grain boundaries [15,21].…”
Section: Introductionmentioning
confidence: 99%