2023
DOI: 10.1109/tasc.2023.3259919
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Fabrication Development for SPT-SLIM, a Superconducting Spectrometer for Line Intensity Mapping

Abstract: Line Intensity Mapping (LIM) is a new observational technique that uses low-resolution observations of line emission to efficiently trace the large-scale structure of the Universe out to high redshift. Common mm/sub-mm emission lines are accessible from ground-based observatories, and the requirements on the detectors for LIM at mm-wavelengths are well matched to the capabilities of large-format arrays of superconducting sensors. We describe the development of an R = λ/∆λ = 300 on-chip superconducting filter-b… Show more

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