1992
DOI: 10.1116/1.585957
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Fabrication of encapsulated silicon-vacuum field-emission transistors and diodes

Abstract: We have succeeded in developing encapsulated silicon-vacuum field-emission transistors by using integrated circuit technology. This success will accelerate the development of integrated circuit of silicon-vacuum field-emission devices. Preliminary electrical characteristics of these encapsulated silicon-vacuum field-emission transistors show very similar characteristics to the gated field-emitter diode. However, the turn-on voltage and the transconductance are lower compared to the open gated field emitters.

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Cited by 13 publications
(3 citation statements)
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“…Planar fabrication processes have been used to fabricate a variety of FEAs, including arrays with Mo [36][37][38][39]44,45,[61][62][63][64][65], Si [66][67][68], and GaAs [69] tips. Arrays having a tip density as large as 10 9 tips/cm 2 have been fabricated [62].…”
Section: Microwave Amplifiersmentioning
confidence: 99%
“…Planar fabrication processes have been used to fabricate a variety of FEAs, including arrays with Mo [36][37][38][39]44,45,[61][62][63][64][65], Si [66][67][68], and GaAs [69] tips. Arrays having a tip density as large as 10 9 tips/cm 2 have been fabricated [62].…”
Section: Microwave Amplifiersmentioning
confidence: 99%
“…7,[18][19][20] This field emission process is enhanced by concentration of the electric field at sharp asperities 7,21,22 and reduction of the potential barrier with low work function cathode materials. [26][27][28] and ferroelectric tip emitter arrays with turn-on electric fields of 4-19 V/lm. The electron emission turn-on field, E ON , can be defined as the electric field necessary to generate a current density of 0.5 lA/cm 2 .…”
Section: Introductionmentioning
confidence: 99%
“…Some research groups studied various vacuum sealing methods to operate vacuum devices under general conditions. These techniques are based on a microelectronic mechanical systems (MEMS) structure. However, this fabrication process is complicated and requires many fabrication steps. Moreover, the sealing size level is still at the micrometer level or even a millimeter scale.…”
mentioning
confidence: 99%