2009
DOI: 10.1143/apex.2.091403
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Fabrication of Flat MgO(111) Films on Al2O3(0001) Substrates by Pulsed Laser Deposition

Abstract: We have found that epitaxial MgO(111) thin films grow under a wide range of deposition conditions (substrate temperatures of 400 -800 C, oxygen partial pressures of 10 À4 -10 0 Pa) on -Al 2 O 3 (0001) substrates by pulsed laser deposition (PLD), despite the strongly divergent electrostatic potential of MgO(111). The surfaces of the resulting thin films show step-and-terrace structures reflecting the surface of -Al 2 O 3 (0001) with a small root-mean-square roughness of 0.62 nm even at a film thickness of 80 n… Show more

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Cited by 19 publications
(22 citation statements)
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“…In MgO each cation (Mg 2þ ) layer and anion (O 2À ) layer is alternately stacked along the [111] direction as shown in Fig. 2 [18][19][20][21][22][23][24][25][26] and in LaAlO 3 positively charged (LaO) þ layer and negatively charged (AlO 2 ) À layer is stacked along the [001] direction as shown in Fig. 3.…”
Section: Introductionmentioning
confidence: 99%
“…In MgO each cation (Mg 2þ ) layer and anion (O 2À ) layer is alternately stacked along the [111] direction as shown in Fig. 2 [18][19][20][21][22][23][24][25][26] and in LaAlO 3 positively charged (LaO) þ layer and negatively charged (AlO 2 ) À layer is stacked along the [001] direction as shown in Fig. 3.…”
Section: Introductionmentioning
confidence: 99%
“…Such a surface has attracted a great deal of attention from both experimental and theoretical studies. [5][6][7][8][9][10][11][12][13][14][15][16][17][18][19] In spite of the large number of studies made, many features of this process are not yet understood. Therefore, the investigations described herein are aimed at better understanding the microstructural details of MgO(111) films.…”
mentioning
confidence: 99%
“…Since the kinetic energy of ablated species decreases with the oxygen partial pressure, the observed significant roughening at 1 Pa means that the kinetic energy of the ablated species is so small that the growth kinetics is similar to that of MBE, indicating that the high-energy growth process of PLD contributes to the formation of the flat polar surface. MgO(111) (111) substrates with a NiO(111) buffer layer [106]. We have confirmed the atomically flat (111) surface by recording RHEED intensity oscillations during the film growth and by observing the single-step and terrace structure using AFM.…”
Section: Fabrication Of Flat Mgo(111) Films Onmentioning
confidence: 61%
“…Recently, much effort has been spent to grow atomically flat MgO(111) films on Al 2 O 3 (0001) [101,102], GaN(0001) [103], 6H-SiC(0001) [104], and Ag(111) [105] substrates, and successful results were achieved only for Ag (111). In this section, we review our recent growth studies of flat MgO(111) films on Al 2 O 3 (0001) [106] and on YSZ(111) with a NiO(111) buffer [107]. MgO(111) film growth on Al 2 O 3 (0001) is practically important because Al 2 O 3 (0001) is a common commercially available substrate.…”
Section: Introductionmentioning
confidence: 99%