2023
DOI: 10.1016/j.jeurceramsoc.2022.11.018
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Fabrication of high-efficiency dielectric patch antennas from temperature-stable Sr3−xCaxV2O8 microwave dielectric ceramic

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Cited by 28 publications
(5 citation statements)
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“…Over the entire sintering temperature range spanning 1415–1515°C, the FWHM undergoes a characteristic trajectory of diminishing, followed by amplification. Remarkably, this trend contrasts with the behavior observed for the Q × f value of the sample 43,44 . Typically, the FWHM of a prominent band in the Raman spectrum exhibits an inverse relationship with the Q × f value.…”
Section: Resultscontrasting
confidence: 68%
See 1 more Smart Citation
“…Over the entire sintering temperature range spanning 1415–1515°C, the FWHM undergoes a characteristic trajectory of diminishing, followed by amplification. Remarkably, this trend contrasts with the behavior observed for the Q × f value of the sample 43,44 . Typically, the FWHM of a prominent band in the Raman spectrum exhibits an inverse relationship with the Q × f value.…”
Section: Resultscontrasting
confidence: 68%
“…Remarkably, this trend contrasts with the behavior observed for the Q × f value of the sample. 43,44 Typically, the FWHM of a prominent band in the Raman spectrum exhibits an inverse relationship with the Q × f value. At the zenith of the Q × f value, TA B L E 3 Microwave properties of various microwave dielectric ceramics including Na and Si systems with similar relative permittivity.…”
Section: Resultsmentioning
confidence: 99%
“…The microwave dielectric properties of the sintered ceramics were assessed via by the Hakki-Coleman method, by using a microwave network analyzer (N5234A, Agilent Co.). 12,13 The temperature coefficients of resonant frequency were calculated at approximately 25-85 • C in TE 01𝛿 mode using the following formula (Equation 1) 14,15 :…”
Section: Characterization Methodsmentioning
confidence: 99%
“…The microwave dielectric properties of the sintered ceramics were assessed via by the Hakki–Coleman method, by using a microwave network analyzer (N5234A, Agilent Co.) 12,13 . The temperature coefficients of resonant frequency were calculated at approximately 25–85°C in normalTE01δ${\mathrm{T}}{{\mathrm{E}}_{01{{\delta}}}}$ mode using the following formula (Equation ) 14,15 : 0.28emτfbadbreak=1f()T00.28emfT1fT0T1T0,$$\begin{equation}{\mathrm{\;}}{\tau _f} = \frac{1}{{f\left( {{T_0}} \right)}}\;\frac{{\left[ {f\left( {{T_1}} \right) - f\left( {{T_0}} \right)} \right]}}{{{T_1} - {T_0}}},\end{equation}$$where ffalse(T1false)$f( {{T_1}} )$ and ffalse(T0false)$f( {{T_0}} )$ represented the resonant frequency at T1${T_1}$(85°C) and T0${T_0}$(25°C), respectively.…”
Section: Experimental Procedures and Computational Methodsmentioning
confidence: 99%
“…The content of oxygen vacancies and different valence ions in ceramics was characterized by X-ray photoelectron spectroscopy (XPS). Also, the microwave dielectric properties of the sintered ceramics were conducted by Hakki-Coleman method using a microwave network analyzer (N5234A, Agilent Co., USA) [11,12]. The temperature coefficients of resonant frequency were calculated at 25-85 ℃ in mode by Eq.…”
Section: Te01δmentioning
confidence: 99%