2004
DOI: 10.1116/1.1701848
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Fabrication of high-quality-factor photonic crystal microcavities in InAsP/InGaAsP membranes

Abstract: . 83, 1915 ͑2003͔͒ resonant mode linewidths of 0.10 nm ͑corresponding to a quality factor ϳ1.3ϫ10 4 ) were measured in a photonic crystal defect microcavity fabricated in an InAsP/ InGaAsP multi-quantum-well membrane. The quality of device fabrication is of critical importance in the performance of these devices. Here, we present the results of key processing steps, including inductively coupled plasma reactive ion etching of a SiO 2 mask and the InAsP/InGaAsP membrane, and a selective undercut wet etch of an … Show more

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Cited by 11 publications
(5 citation statements)
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“…An inductively-coupled reactive-ion etch was used to transfer the disk pattern through the hard mask and the 252 nm thick semiconductor layer. The disks were then undercut, and the pedestal formed, using HCl:H 2 O solution [16]. A scanning electron microscope (SEM) micrograph of a final device including remaining SiN x cap is shown in Fig.…”
mentioning
confidence: 99%
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“…An inductively-coupled reactive-ion etch was used to transfer the disk pattern through the hard mask and the 252 nm thick semiconductor layer. The disks were then undercut, and the pedestal formed, using HCl:H 2 O solution [16]. A scanning electron microscope (SEM) micrograph of a final device including remaining SiN x cap is shown in Fig.…”
mentioning
confidence: 99%
“…The disks were then undercut, and the pedestal formed, using HCl: H 2 O solution. 16 A scanning electron microscope ͑SEM͒ micrograph of a final device including remaining SiN x cap is shown in Fig. 1͑b͒.…”
mentioning
confidence: 99%
“…2(d)). Next, with the help of photolithography and a hydrochloric acid (HCl) based wet-etching solution, we remove a substantial amount of InP substrate below InGaAsP [22][23][24]. In step e, the areas to be wet-etched are opened in the negative-tone NR9-1500PY photoresist spun at 3500 rpm for 40 s to yield a thickness of 1.5 μm.…”
Section: Device Famentioning
confidence: 99%
“…However, at this stage, it is difficult to fabricate very fine InP PCs compared to Si and GaAs-based PCs. InP PCs with a relatively fine structure have been reported as being obtained by using Clz-based inductively coupled plasma (ICP) etching [2]- [4] or chemically assisted ion beam etching [5]- [7]. However, a high substrate temperature of over 200 "C was necessary to etch the InP compounds to desorb the etching products, due to the low volatility of the indium chloride products.…”
mentioning
confidence: 99%