Fabrication Of High Quality Qc Films Via The Route Of The Amorphous Phase

Haberkern, R.; Roth, Connie B.; Knöfler, R.; Schulze, Livia; Häußler, P.

doi:10.1557/proc-553-13

Cited by 10 publications

(7 citation statements)

References 2 publications

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“…Many investigations performed previously have focused on the presence of an amorphous phase as the precursor to the quasicrystalline one 6,7,8 . However, diffraction patterns of "as-deposited" films in this present work suggest that they were composed of nano-scale grains, which had quasicrystalline and its approximants phase structures.…”

Section: Resultsmentioning

confidence: 99%

An Investigation of Sputtered Al-Cu-Fe-Cr Quasicrystalline Films Via Synchrotron Diffraction

et al. 2000

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Analysis of the phase relationships of Al-Cu-Fe-Cr based sputtered films, before and after various annealing treatments, was carried out via grazing incidence x-ray scattering (GIXS) at SSRL on beamline 7-2. The "as-deposited" films were composed primarily of nanoscale grains whose structure were mainly quasicrystalline (QC) and its approximants, plus a nano-crystalline phase was also observed in one sample. None of these precursor films exhibited any degree of amorphous character. GIXS studies, in the symmetric and asymmetric modes, revealed that grain growth due to the post-deposition heat treatments caused a decagonal QC phase to evolve and dominate the crystalline phases, which composed the film. These §Ã Ã µm thick films were created by sputter deposition with a DC magnetron source via an Al-Cu-Fe-Cr powder pressed target, giving a nominal sample composition of Al 75 Cu 4 Fe 8 Cr 10 O 3 . Two types of annealing treatments were performed using an Argon atmosphere. Anneal of a precursor film for 4 hours at 500°C showed a large fraction of decagonal and approximant phases, while anneal of a precursor film for 2 hours at 400°C and 2 hours at 550°C showed a large fraction of the crystalline phase.

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Section: Resultsmentioning

confidence: 99%

An Investigation of Sputtered Al-Cu-Fe-Cr Quasicrystalline Films Via Synchrotron Diffraction

et al. 2000

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“…Contacts were made to the films using silver paint. Additional details on film preparation and characterization by electron diffraction can be found in [17].…”

Section: Methodsmentioning

confidence: 99%

“…An example of metallic behaviour is shown in figure 1 where the quasicrystal AlPdRe film No C5 exhibits w which tend to zero as T → 0 K. This film has an R(4.2 K)/R(300 K) ratio of 2.4. For this metallic case, a least-squares regression fit of the log(wσ ) versus log T data yields values for the exponent z and the prefactor C, according to equations ( 12) and (17). A value for σ (0) follows directly from one of the data points.…”

Section: Low Temperature Conductivity Data and The Metal-insulator Tr...mentioning

confidence: 99%

Magnetoconductivity of AlPdRe quasicrystalline films

Milner

Gerber

Rosenbaum

et al. 1999

J. Phys.: Condens. Matter

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Magnetoconductivity (MC) and zero field conductivity have been measured at low temperatures in metallic and barely insulating AlPdRe quasicrystalline films. For a metallic film, both the magnetoconductivity and conductivity can be fitted well using the 3D weak localization (WL) and electron-electron interaction (EEI) theories. The AlPdRe films exhibit very strong spin-orbit scattering with . Therefore, the inelastic scattering times can be directly extracted from the low field magnetoconductivity data taken at various temperatures, yielding . Using the fitting parameters extracted from the MC data, the zero field conductivity as a function of temperature can be described nicely using the WL and EEI theories. MC data and conductivity data obtained on barely insulating films below the metal-insulator transition cannot be explained in the framework of the WL theory.

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“…Thin amorphous 2200 Å films with nominal compositions near Al 72 Pd 20 Re 8 were prepared by co-sputtering with two magnetron sources onto quartz glass substrates, as illustrated in figure 1 [20]. One target source contained an AlPd alloy and the second source contained the Re element.…”

Section: Film Preparation and Measurement Detailsmentioning

confidence: 99%

“…Thus, the possibility of a small shift in composition due to preferential evaporation losses of Al and maybe of Pd cannot be excluded. Details of the film preparation are reported in reference [20]. X-ray diffraction, SEM, and TEM showed that the resulting films are single-phased icosahedral with grain sizes up to 1 µm [20]; the electron micrographs displayed fivefoldsymmetry patterns [21].…”

Section: Film Preparation and Measurement Detailsmentioning

confidence: 99%

The metal-insulator transition in icosahedral AlPdRe thin films

Rosenbaum

Haberkern

Häußler

et al. 2000

J. Phys.: Condens. Matter

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Thin 2200 Å icosahedral films with compositions near Al 72 Pd 20 Re 8 have been fabricated on quartz glass substrates. Some of the films exhibited insulating transport properties down to 0.07 K where their resistivities followed an activated 'Mott' variable-range hopping law. Other films exhibited metallic transport properties. In addition, the precursor amorphous AlPdRe films were observed to make superconducting transitions below 0.6 K; thus the amorphous and icosahedral structures exhibit contrasting metallic and insulating transport behaviours.

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Fabrication Of High Quality Qc Films Via The Route Of The Amorphous Phase

Cited by 10 publications

References 2 publications

An Investigation of Sputtered Al-Cu-Fe-Cr Quasicrystalline Films Via Synchrotron Diffraction

An Investigation of Sputtered Al-Cu-Fe-Cr Quasicrystalline Films Via Synchrotron Diffraction

Magnetoconductivity of AlPdRe quasicrystalline films

The metal-insulator transition in icosahedral AlPdRe thin films

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