Fabrication of Integrated Two-Axis High-$T_{\rm c}$ Planar Gradiometer

Tsukamoto, Akira; Adachi, Seiji; Oshikubo, Y.; Kawano, J.; Hato, Tsunehiro; Tanabe, K.

doi:10.1109/tasc.2010.2099094

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Non-destructive Evaluation (Nde) System For Deep-lying Defects1

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Cited by 9 publications

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“…We fabricated a 2-axis planar-type HTS-SQUID gradiometer chipshown in Fig. 19 [43], [44]. Two gradiometers having a baseline of 8.5 mm were orthogonally prepared on a chip.…”

Section: Non-destructive Evaluation (Nde) System For Deep-lying Defectsmentioning

confidence: 99%

Recent Developments of High-Tc Electronic Devices with Multilayer Structures and Ramp-Edge Josephson Junctions

Adachi

Tsukamoto

Hato

et al. 2012

IEICE Trans. Electron.

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Recent developments of electronic devices containing Josephson junctions (JJ) with high-T c superconductors (HTS) are reported. In particular, the fabrication process and the properties of superconducting quantum interference devices (SQUIDs) with a multilayer structure and ramp-edge-type JJs are described. The JJs were fabricated by recrystallization of an artificially deposited Cu-poor precursory layer. The formation mechanism of the junction barrier is discussed. We have fabricated various types of gradiometers and magnetometers. They have been actually utilized for several application systems, such as a non-destructive evaluation (NDE) system for deep-lying defects in a metallic plate and a reel-to-reel testing system for striated HTS-coated conductors.

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“…We fabricated a 2-axis planar-type HTS-SQUID gradiometer chipshown in Fig. 19 [43], [44]. Two gradiometers having a baseline of 8.5 mm were orthogonally prepared on a chip.…”

Section: Non-destructive Evaluation (Nde) System For Deep-lying Defectsmentioning

confidence: 99%