2019
DOI: 10.3379/msjmag.1907r002
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Fabrication of <i>L</i>1<sub>0</sub>-FeNi films by denitriding FeNiN films

Abstract: L10-FeNi films textured with the a-axis perpendicular to the film plane were successfully fabricated by denitriding FeNiN films. 20-nm-thick FeNiN films with two variants were epitaxially grown on SrTiO3(001), MgAl2O4(001), and MgO(001) substrates by molecular beam epitaxy. Denitriding was performed by annealing at 300 °C for 4 h under an H2 gas atmosphere. The epitaxial relationships were L10-FeNi[001](100) || substrate[100](001) and L10-FeNi[010](100) || substrate[100](001). The uniaxial magnetic anisotropy … Show more

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Cited by 5 publications
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“…3(a). 24 Figures 1(a 23,24 In other words, the two variants with the in-plane c-axis of FeNiN intersecting at 90 were formed indicated by variants A and B in Fig. 1(c).…”
mentioning
confidence: 98%
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“…3(a). 24 Figures 1(a 23,24 In other words, the two variants with the in-plane c-axis of FeNiN intersecting at 90 were formed indicated by variants A and B in Fig. 1(c).…”
mentioning
confidence: 98%
“…This high S value exceeds the values reported previously. 2,10,11,16,17 20 nm-thick FeNiN films were grown by the simultaneous supply of Fe, Ni, and radio frequency N 2 by MBE 23,24 by changing the growth temperature (T S ) to 200, 250, and 350 C. After the growth, the FeNiN films were annealed at 300 C for 4 h in a furnace with a 1.0 l/min H 2 gas flow rate for denitriding, resulting in the fabrication of L1 0 -FeNi films. The thicknesses of the L1 0 -FeNi films were estimated by x-ray reflectometry.…”
mentioning
confidence: 99%