“…PXRD patterns of the series of Cu–GO@m-SiO 2 - A , B , and C nanocomposites are shown in Figure S5, Supporting Information. Cu–GO@m-SiO 2 - A and B exhibited broad diffraction peaks in the range of 2θ = 15°–35°, which could be assigned to the graphene nanosheet-supported metal NPs tightly covered by mesoporous silica (m-SiO 2 ) layers. , One strong peak along with two very weak diffraction peaks appeared at 2θ = 43.3°, 50.4°, and 74.1° in Cu–GO@m-SiO 2 - A , B catalysts which could be nicely indexed to the (111), (200), and (220) crystalline reflection planes, respectively, corresponding to cubic Cu(0)-NPs (JCPDS card no. 04-0836). ,, In contrast, the Cu–GO@m-SiO 2 - C material exhibited three distinct peaks; in addition, other diffraction peaks were noticed at 2θ = 16.2°, 17.5°, 31°, 32.4°, 39.8°, 50.0°, 53.6°, and 57.3°, which could be readily assigned to (111), (003), (021), (113), (024), (033), (220), and (223) planes, respectively, of (Cu 2 Cl(OH) 3 ) (JCPDS card no.…”