2014
DOI: 10.1007/s11664-014-3308-x
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Fabrication of Relaxer-Based Piezoelectric Energy Harvesters Using a Sacrificial Poly-Si Seeding Layer

Abstract: The effect of a polycrystalline silicon (poly-Si) seeding layer on the properties of relaxor Pb(Zr 0.53 ,Ti 0.47 )O 3 -Pb(Zn 1/3 ,Nb 2/3 )O 3 (PZT-PZN) thin films and energy-harvesting cantilevers was studied. We deposited thin films of the relaxor on two substrates, with and without a poly-Si seeding layer. The seeding layer, which also served as a sacrificial layer to facilitate cantilever release, was found to improve morphology, phase purity, crystal orientation, and electrical properties. We attributed th… Show more

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Cited by 10 publications
(3 citation statements)
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“…Many studies have been conducted to develop new piezoelectric ceramics for applications in piezoelectric harvesters and multilayer devices . In particular, the (1− x )Pb(Zr 1− y Ti y )O 3 ‐ x Pb(Zn 0.4 Ni 0.6 ) 1/3 Nb 2/3 O 3 ceramics have been extensively investigated for such applications because of their large d 33 value and relatively small ε 33 / ε o value .…”
Section: Introductionmentioning
confidence: 99%
“…Many studies have been conducted to develop new piezoelectric ceramics for applications in piezoelectric harvesters and multilayer devices . In particular, the (1− x )Pb(Zr 1− y Ti y )O 3 ‐ x Pb(Zn 0.4 Ni 0.6 ) 1/3 Nb 2/3 O 3 ceramics have been extensively investigated for such applications because of their large d 33 value and relatively small ε 33 / ε o value .…”
Section: Introductionmentioning
confidence: 99%
“…As seen in the plot of output power versus resonant frequency in Figure 5a, our power values achieved in the Type I harvesters were compared with the values reported for the unimorph or bimorph cantilevers based on PZT or relaxor-PZT materials. [25,[27][28][29][30]49,[51][52][53][54][55][56][57][58] All corresponding values with information on the sample dimensions and measurement conditions are presented in Table S4 (Supporting Information). Most of the reported studies were based on the results measured at vibrational resonant frequency greater than 70 Hz.…”
Section: Figure 1a-c Shows the X-ray Diffraction (Xrd) Patterns Of Th...mentioning
confidence: 99%
“…11 The relaxor PZT-PZN thin lms (0.810 mm thick) were then deposited on top of the TiO 2 layer and crystallized at 675 C for 30 min in air to obtain phase-pure relaxor lms. 10,11,19 The patterning, wet etching, and cantilever release steps were carried out in a class 1000 clean room. The rst photolithography step involved patterning of 50 nm RuO 2 /40 nm Cr/400 nm Au interdigitated electrodes (IDEs).…”
Section: Cantilever and Device Fabricationmentioning
confidence: 99%