“…Generally, high‐resistivity float zone silicon (HRFZ‐Si) ring cavity based on ridge waveguides are fabricated by CMOS technology
10,11 . In this case, the performance of resonators is typically limited by a relatively large absorption loss (e.g., 0.025
in 0.4 THz ~ 2 THz for HRFZ‐Si, which is two orders of magnitude larger than the absorption loss of optical materials in near‐infrared light)
10,11,16–21 . As a result, a relatively low‐quality factor (e.g., typically at the order of
with bending radius of 3mm)of the on‐chip THz resonator is generally reported, which highly limits the application of on‐chip THz sensors
10,11 .…”