Fabrication of Thick REBCO–Coated Conductors with High Performance on Metal Tapes by Pulsed Laser Deposition Process

Liu, Linfei; Li, Yiyie; Xiao, Guina; Wu, Xiang

doi:10.1007/s10948-014-2730-x

Cited by 8 publications

(4 citation statements)

References 8 publications

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“…For example, if we double the thickness of a tape and retain the same J c in high fields, we can expect the selffield J c to decrease by ∼ 20 %. A decrease in self-field J c with thickness has been seen by many authors [17]- [22] (but not all [23]) and is often attributed to defects.…”

Section: Self Field Calculationsmentioning

confidence: 85%

Self-Field Effects in a Josephson Junction Model for ${J_\text{c}}$ in REBCO Tapes

Gurnham

Hampshire

2022

IEEE Trans. Appl. Supercond.

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We have modeled the effects of self-field on the critical current density Jc in high temperature superconducting REBCO tapes, by considering them as a collection of Josephson junctions (JJs) in parallel. We have used a 2D JJ framework for each junction and included their component self-field effects using the well known expression for the magnetic field produced by a thin strip. We provide computational and analytic expressions for the spatial distribution of Jc, enabling us to calculate the critical current of coated conductors over the whole field range. We find that Jc in self field for thin tapes is broadly independent of the width but strongly dependent on the thickness of the tape. For example, if a tape thickness is doubled, even if Jc is unchanged in high field, we expect the self-field Jc to drop by ∼ 20 % because of the larger self-field produced. Our results are compared to experimental results for technological coated conductors from the literature and good agreement is found.

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Section: Self Field Calculationsmentioning

confidence: 85%

Self-Field Effects in a Josephson Junction Model for ${J_\text{c}}$ in REBCO Tapes

Gurnham

Hampshire

2022

IEEE Trans. Appl. Supercond.

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“…On the conductor development side, the introduction and development of artificial pinning centers (APCs) have resulted in a remarkable improvement of in-field performance over a wide range of temperatures and fields . In addition, the problems associated with the growth of thicker (>1 µm) films without degradation of critical current density (J c ) have been addressed [14][15][16][17][35][36][37][38][39][40][41][42][43][44][45][46][47], resulting in a notable increase in CC performance via growth of >4 µm thick films with optimized APCs, as demonstrated for intermediate temperatures and fields (30-50 K, 3-7 T), as well as at 4.2 K and fields up to 31.2 T [15,16,33].…”

Section: Introductionmentioning

confidence: 99%

Scanning Raman spectroscopy for inline characterization of 2G-HTS conductors

Castaneda¹,

Majkic²,

Robles³

2021

Supercond. Sci. Technol.

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We report on a feasibility study of using Raman micro-spectroscopy as a characterization method for quality control of REB a 2 C u 3 O 7 − δ (REBCO, rare-earth barium copper oxide) coated conductors (CC). Fragments of long REBCO tape deposited using advanced metal organic chemical vapor deposition with dropouts in critical current (I c) were analyzed implementing Raman spectroscopy in area scan (map) and linear scan modes, in order to evaluate the level of information obtainable with the technique. The areal maps have been found to provide detailed information on the spatial distribution of the sample quality, providing maps of both intensity and wavelength shift characteristic of Raman-active peaks. The maps readily identify defective regions ranging from completely misoriented a-axis domains (REBCO a-axis || sample normal), as well as regions with well-textured c-axis orientation (REBCO c-axis || sample normal) but with significant variation in cation disorder. The results are complemented with linear scans carried out by two-dimensional x-ray diffraction, which do identify the a-axis grain regions but do not detect any apparent anomaly in the cation-disordered region detected by Raman micro-spectroscopy. The results indicate that scanning Raman spectroscopy has the potential to be utilized as a fast, insightful, and reliable characterization, quality, and process control technique for both CC optimization and increase of manufacturing yield.

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“…Significant progress in understanding and overcoming obstacles to growing thick REBCO films with high current densities has been made in recent years [16][17][18][19][20][21][22][23][24][25][26][27][28][29][30][31][32]. Additionally, the understanding and control of the parameters influencing the effectiveness of artificial pinning centers (APC) in increasing in-field critical currents has significantly progressed from both fundamental and processing aspects [16-18, 20, 33-61].…”

Section: Introductionmentioning

confidence: 99%

In-field critical current performance of 4.0 μm thick film REBCO conductor with Hf addition at 4.2 K and fields up to 31.2 T

Majkic

Pratap

Paidpilli

et al. 2020

Supercond. Sci. Technol.

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We present results on the in-field critical current (I c ) performance of 4.0 µm thick REBCO film with 15% Hf addition with fields up to 31.2 T and field orientations in the B∥ab plane and B∥c axis. Unlike the behavior at B∥c, the critical current at B∥ab is only very weakly dependent on field, decreasing from self-field to 31.2 T by only 22%, i.e. from the self-field value of ∼7700 A/4 mm width to ∼6300 and 5812 A/4 mm width at 14 and 30 T, respectively. These values are remarkably 3 and 5.7x higher than the corresponding critical currents at B∥c. The in-field behavior of the present 15% Hf sample at field orientation B∥c axis is nearly identical to the previously reported record values found in 4.3 and 4.6 µm thick 15% Zr samples in terms of critical current density. In contrast to the pinning force behavior in the B∥c orientation, which saturates to a constant value of 1.7 TN m −3 above ∼5-6 T, the pinning force in the B∥ab orientation increases near-linearly, reaching a remarkable value of over 11.5 TN m −3 at 31.2 T. These results demonstrate the potential of thick REBCO conductors at 4.2 K for high field and energy density applications, in particular where the magnetic field is contained near the ab-plane.

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Fabrication of Thick REBCO–Coated Conductors with High Performance on Metal Tapes by Pulsed Laser Deposition Process

Cited by 8 publications

References 8 publications

Self-Field Effects in a Josephson Junction Model for ${J_\text{c}}$ in REBCO Tapes

Self-Field Effects in a Josephson Junction Model for ${J_\text{c}}$ in REBCO Tapes

Scanning Raman spectroscopy for inline characterization of 2G-HTS conductors

In-field critical current performance of 4.0 μm thick film REBCO conductor with Hf addition at 4.2 K and fields up to 31.2 T

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