Electrical and optical properties of Nb-doped TiO 2 films deposited by dc magnetron sputtering using slightly reduced Nb-doped TiO 2 − x ceramic targets J. Vac. Sci. Technol. A 28, 851 (2010); 10.1116/1.3358153 rf magnetron sputter deposition of transparent conducting Nb-doped Ti O 2 films on Sr Ti O 3 Transparent and semitransparent conducting film deposition by reactive-environment, hollow cathode sputtering A transparent metal: Nb-doped anatase Ti O 2The authors report stoichiometry control and postdeposition annealing-free fabrication of Nb-doped transparent anatase TiO 2 ͑A-TiO 2 :Nb͒ films on alkaline-free glass substrates by helicon-wave-excited-plasma sputtering. The films tended to crystallize in the stable electrically semi-insulating rutile phase. However, although the appropriate deposition condition window was narrow, precise stoichiometry control using near-reducing ambient, namely, the deposition temperature higher than 450°C and O 2 partial pressure ͑P O 2 ͒ in the range between 5 ϫ 10 −4 and 1 ϫ 10 −2 Pa, enabled the deposition of a high refractive index semiconducting anatase phase. The electron concentration of the A-TiO 2 : Nb films increased with increasing Nb concentration up to Ti 0.907 Nb 0.093 O 2 . The results indicate that the Nb 5+ donor on the Ti 4+ site can be activated under near-reducing atmosphere where unwanted compensating defects may be passivated. As a result, anatase Ti 0.907 Nb 0.093 O 2 film deposited at 500°C and P O 2 =5ϫ 10 −4 Pa exhibited a resistivity of 3.4ϫ 10 −3 ⍀ cm and an optical transmittance higher than 90%. The refractive index of A-TiO 2 :Nb was found to be approximately 2.63 at 450 nm with spectroscopic ellipsometry, which is comparable to the InGaN alloys.