Ultraviolet (UV) detection characteristics of Ag Schottky contacts with ZnO nanorods (ZnONRs) grown on Indium Tin Oxide (ITO)-coated glass substrates have been investigated. A lowtemperature hydrothermal method was used for growing ZnO-NRs. Circular contacts of Ag were deposited above the ZnO-NRs/ITO samples using the shadow mask technique. The structural properties of the ZnO-NRs were characterized by using scanning electron microscopy (SEM), atomic force microscope (AFM) and X-ray di®raction (XRD). The results revealed a (0002) crystal orientation and a wurtzite hexagonal structure. The electrical characteristics of the Ag/ ZnO-NR Schottky contacts were studied at forward applied bias over the range 0 V to 1 V, under dark and UV illumination. The dark and photocurrents were 1:29 Â 10 À5 A and 2:16 Â 10 À5 A, respectively, and the contrast ratio (ratio of photocurrent to dark current) was 1.67 at þ1.0 V for these devices. The results show that these devices could be useful for cost-e®ective and low-voltage UV detection applications.