Fabrication, thermal stability, and reflectivity measurements of Mo/Si multilayers as x-ray mirrors and other optical components

Kloidt, A.; Stock, Hans-Jürgen; Kleineberg, Ulf; Doehring, Thorsten; Proepper, Michael; Nolting, K.; Heidemann, B.; Tappe, T.; Schmiedeskamp, B.; Heinzmann, Ulrich; Krumrey, Michael; Mueller, Peter; Scholze, Frank; Hormes, F. J.; Heidemann, Klaus

doi:10.1117/12.140592

SPIE Proceedings

1993

DOI: 10.1117/12.140592

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Fabrication, thermal stability, and reflectivity measurements of Mo/Si multilayers as x-ray mirrors and other optical components

A. Kloidt

Hans-Jürgen Stock

Ulf Kleineberg

et al.

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“…We determined the light polarization state using W͞Si multilayers with 40 periods each 2.0 nm thick as a reflection analyzer [11,12]. By rotating the multilayers azimuthally around the light axis the ellipticity and the spatial orientation of the polarization ellipse were determined.…”

mentioning

confidence: 99%

Spin Polarized Auger Electrons: The XeM4,5N4,5
Snell
¹
,
Drescher
²
,
Müller
³

et al. 1996
Phys. Rev. Lett.
49
0
27
0
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The spin polarization of the Xe M 4,5 N 4,5 N 4,5 Auger electrons was measured after photoionization of free atoms by circularly polarized synchrotron radiation at 834.5 eV. Significant polarization effects were found across the whole Auger group. With the hole state orientation determined from the spin polarization of the M 4 1 S 0 Auger line the intrinsic Auger parameters were evaluated for all lines. The orientation derived from the 1 S 0 Auger line is consistent with the measured spin polarization of the 3d 3͞2 photoline in good agreement with the two-step model of the Auger decay. [S0031-9007(96)

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mentioning

confidence: 99%

Spin Polarized Auger Electrons: The XeM4,5N4,5
Snell
¹
,
Drescher
²
,
Müller
³

et al. 1996
Phys. Rev. Lett.
49
0
27
0
View full text Add to dashboard Cite

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W/Si multilayers deposited by hot-filament MOCVD

et al. 1999

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Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter

Drescher

Snell

Kleineberg

et al. 1997

Review of Scientific Instruments

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Design of a beamline for soft and deep lithography on third generation synchrotron radiation source Rev.A W/Si multilayer was used to determine the degree of circular polarization of the soft x-ray radiation of the European Synchrotron Radiation Facility helical undulator HELIOS I. The multilayer, manufactured by vapor deposition serves as a wideband tunable polarization analyzer in the photon energy range from 520 to 930 eV. The characterization of the multilayer's analyzing power, varying from 0.82 to 0.25 for these energies, indicates that it operates close to its calculated specifications. The lack of phase-shifters applicable in this energy range was overcome by a detailed analysis of the unpolarized background identified as radiation from the magnetic lattice. In this way, the degree of circular polarization of HELIOS I was determined to exceed 0.85 for hϾ685 eV.

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Fabrication, thermal stability, and reflectivity measurements of Mo/Si multilayers as x-ray mirrors and other optical components

Cited by 4 publications

References 0 publications

Spin Polarized Auger Electrons: The XeM4,5N4,5
Snell
¹
,
Drescher
²
,
Müller
³

et al. 1996
Phys. Rev. Lett.
49
0
27
0
View full text Add to dashboard Cite

Spin Polarized Auger Electrons: The XeM4,5N4,5
Snell
¹
,
Drescher
²
,
Müller
³

et al. 1996
Phys. Rev. Lett.
49
0
27
0
View full text Add to dashboard Cite

W/Si multilayers deposited by hot-filament MOCVD

Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter

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Fabrication, thermal stability, and reflectivity measurements of Mo/Si multilayers as x-ray mirrors and other optical components

Cited by 4 publications

References 0 publications

Spin Polarized Auger Electrons: The XeM4,5N4,5Snell1, Drescher2, Müller3 et al. 1996Phys. Rev. Lett.490270View full textAdd to dashboardCite

Spin Polarized Auger Electrons: The XeM4,5N4,5Snell1, Drescher2, Müller3 et al. 1996Phys. Rev. Lett.490270View full textAdd to dashboardCite

W/Si multilayers deposited by hot-filament MOCVD

Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter

Contact Info

Product

Resources

About

Spin Polarized Auger Electrons: The XeM4,5N4,5
Snell
¹
,
Drescher
²
,
Müller
³

et al. 1996
Phys. Rev. Lett.
49
0
27
0
View full text Add to dashboard Cite

Spin Polarized Auger Electrons: The XeM4,5N4,5
Snell
¹
,
Drescher
²
,
Müller
³

et al. 1996
Phys. Rev. Lett.
49
0
27
0
View full text Add to dashboard Cite