2023
DOI: 10.1016/j.engfailanal.2022.106915
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Failure analysis on the premature delamination in the power module of the inverter for new energy vehicles

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Cited by 5 publications
(1 citation statement)
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“…Additionally, a survey based on over 200 products from 80 businesses found that 31% of respondents selected semiconductor-powered devices as the most fragile parts of power converters used for various power applications [11]. Furthermore, many research-ers have emphasized numerous IGBT-module-related research areas and proposed vari-ous techniques and analysis methods for the acceleration testing of these modules to es-timate failure modes in the early stages of the implementation process, such as the analy-sis of IGBT module fault causes presented in [12,13]; the various techniques of accelera-tion testing for fault diagnostic methodologies given in [14][15][16]; the analysis of parameters affecting failure modes in [17]; and the different measuring equipment used in the experimental environment for module fault diagnosis, such as a scanning electron microscope (SEM), X-ray, and an IR camera, as proposed in [18][19][20].…”
Section: Introductionmentioning
confidence: 99%
“…Additionally, a survey based on over 200 products from 80 businesses found that 31% of respondents selected semiconductor-powered devices as the most fragile parts of power converters used for various power applications [11]. Furthermore, many research-ers have emphasized numerous IGBT-module-related research areas and proposed vari-ous techniques and analysis methods for the acceleration testing of these modules to es-timate failure modes in the early stages of the implementation process, such as the analy-sis of IGBT module fault causes presented in [12,13]; the various techniques of accelera-tion testing for fault diagnostic methodologies given in [14][15][16]; the analysis of parameters affecting failure modes in [17]; and the different measuring equipment used in the experimental environment for module fault diagnosis, such as a scanning electron microscope (SEM), X-ray, and an IR camera, as proposed in [18][19][20].…”
Section: Introductionmentioning
confidence: 99%