1980
DOI: 10.1017/s0021900200033854
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Failure distributions of shock models

Abstract: A single device shock model is studied. The device is subject to some damage process. Under the assumption that as the cumulative damage increases, the probability that any additional damage will cause failure increases, we find sufficient conditions on the shocking process so that the life distribution will be increasing failure rate.

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Cited by 7 publications
(2 citation statements)
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“…Remark 1: It is easily derived that is iff is non-increasing in for all (see Gottlieb [14]). Furthermore, using Lemma 3.7 of Barlow and Proschan [3], we can show that is non-increasing in for all .…”
Section: Optimizationmentioning
confidence: 99%
“…Remark 1: It is easily derived that is iff is non-increasing in for all (see Gottlieb [14]). Furthermore, using Lemma 3.7 of Barlow and Proschan [3], we can show that is non-increasing in for all .…”
Section: Optimizationmentioning
confidence: 99%
“…For systems subject only to sporadic jump damages, a compound Poisson process, a stochastic process with independent and identically distributed (i.i.d) jumps that occur according to a Poisson process, is one of the appropriate candidates to model the cumulative damages. Abdel‐Hameed and Gottlieb introduced the life distribution and its properties for systems subject to pure jump damage processes.…”
Section: Introductionmentioning
confidence: 99%