Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs

González, Carlos; Costa, Bruno L.; Machado, Diego N.; Vaz, Rafael Galhardo; Bôas, Alexis C. Vilas; Gonçalez, Odair Lélis; Puchner, H.; Kastensmidt, Fernanda Lima; Medina, N. H.; Guazzelli, Marcilei A.; Balen, Tiago R.

doi:10.1007/s10836-021-05952-2

Cited by 1 publication

(3 citation statements)

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“…This segment-dependent variation on the signal slew rate is explained because the converter is based on a Programmable Capacitor Array (PCA), since it is a charge redistribution SAR. This behavior is associated with the malfunction and failure of the transistors that compose the switches of the PCA, as explained in more detail in [18].…”

Section: B Test Results and Considerationsmentioning

confidence: 99%

“…Considering this converter, the different radiation performance may be attributed to the distinct working principle (comparing to SAR ADCs). The influence of sampling frequency on the performance of both SAR ADCs is detailed in [18], in which the observed effect was reproduced by electrical simulations and the main failure mechanism was elucidated.…”

Section: B Test Results and Considerationsmentioning

confidence: 99%

“…In this work we compile results of several radiation experiments we performed upon the above mentioned system prototyped in the PSoC device [12,13,18]. Results include TID (Cobalt-60 and X-ray) experiments, as well as two heavy ion campaigns.…”

Section: Introductionmentioning

confidence: 99%

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Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions

González

Machado

Vaz³

et al. 2021

JICS

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This work presents results of three distinct radiation tests performed upon a fault-tolerant data acquisition system comprising a design diversity redundancy technique. The first and second experiments are Total Ionizing Dose (TID) essays, comprising gamma and X-ray irradiations. The last experiment considers single event effects, in which two heavy ion irradiation campaigns are carried out. The case study system comprises three analog-to-digital converters and two software-based voters, besides additional software and hardware resources used for controlling, monitoring and memory management. The applied Diversity Triple Modular Redundancy (DTMR) technique, comprises different levels of diversity (temporal and architectural). The circuit was designed in a programmable System-on-Chip (PSoC), fabricated in a 130nm CMOS technology process. Results show that the technique may increase the lifetime of the system under TID if comparing with a non-redundant implementation. Considering the heavy ions experiments the system was proved effective to tolerate 100% of the observed errors originated in the converters, while errors in the processing unit present a higher criticality. Critical errors occurring in one of the voters were also observed. A second heavy-ion campaign was then carried out to investigate the voters reliability, comparing the dynamic cross-section of three different software-based voter schemes implemented in the considered PSoC.

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Section: B Test Results and Considerationsmentioning

confidence: 99%

Section: B Test Results and Considerationsmentioning

confidence: 99%