2020
DOI: 10.1002/lpor.201900011
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Far‐Field Superresolution Imaging via Spatial Frequency Modulation

Abstract: The diffraction limit substantially impedes the resolution of the conventional optical microscope. Under traditional illumination, the high-spatial-frequency light corresponding to the subwavelength information of objects is located in the near-field in the form of evanescent waves, and thus not detectable by conventional far-field objectives. Recent advances in nanomaterials and metamaterials provide new approaches to break this limitation by utilizing large-wavevector evanescent waves. Here, a comprehensive … Show more

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Cited by 18 publications
(8 citation statements)
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References 310 publications
(546 reference statements)
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“…The evanescent‐to‐propagating‐conversion (ETPC) efficiency determines the final imaging resolution. [ 608 ] Further improvement of the resolution can be accomplished by enhancing the ETPC efficiency. These ideas motivated the development of the mSIL superlens discussed below, which provides improved ETPC efficiency with enhanced optical super‐resolution and imaging quality.…”
Section: Microsphere Superlens and Metamaterials Solid Immersion Lensmentioning
confidence: 99%
“…The evanescent‐to‐propagating‐conversion (ETPC) efficiency determines the final imaging resolution. [ 608 ] Further improvement of the resolution can be accomplished by enhancing the ETPC efficiency. These ideas motivated the development of the mSIL superlens discussed below, which provides improved ETPC efficiency with enhanced optical super‐resolution and imaging quality.…”
Section: Microsphere Superlens and Metamaterials Solid Immersion Lensmentioning
confidence: 99%
“…The basic mechanism of the tunable SFS label-free superresolution imaging is shown in figure 1(a). In the SF domain, the finer detail represents higher SF information, only diffraction-limited information can be transmitted to the farfield, leaving a high SF component bound to the object's surface in the form of evanescent waves [27]. A conventional microscope imaging system can be seen as a low pass filter in SF's perspective.…”
Section: Imaging Principlementioning
confidence: 99%
“…The near‐field information can be transformed into far‐field information using near‐field illumination techniques for detection, corresponding to the spatial frequency shift (SFS) in the frequency domain. [ 6 , 7 ] Compared with point scanning methods, [ 1 , 2 ] SFS methods can provide high‐speed, high‐resolution, wide‐field imaging. More importantly, in contrast with STED and SMLM methods, which rely on fluorescence excitation with specific characteristics, manipulation in the Fourier domain is universal and compatible with both label‐free and labeled imaging.…”
Section: Introductionmentioning
confidence: 99%