2008
DOI: 10.1016/j.jallcom.2007.11.076
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Far infrared reflectivity spectra of lead-telluride doped with Ytterbium

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Cited by 16 publications
(5 citation statements)
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“…In the same line, the deposited films showed a relatively high absorption coefficient of around 10 4 cm −1 and exhibited a direct transition gap which lies within 2.6-3.6 eV domain. It has been found that these materials were n-type and electrical measurements are in progress in order to reach the resistivity of such thin films [32][33][34][35][36][37][38][39][40][41]. This result is very encouraging since a costless and simple spray pyrolysis technique can be used to prepare such oxides and open the way of possible valorisation of the prepared films in many optoelectronic applications.…”
Section: Resultsmentioning
confidence: 92%
“…In the same line, the deposited films showed a relatively high absorption coefficient of around 10 4 cm −1 and exhibited a direct transition gap which lies within 2.6-3.6 eV domain. It has been found that these materials were n-type and electrical measurements are in progress in order to reach the resistivity of such thin films [32][33][34][35][36][37][38][39][40][41]. This result is very encouraging since a costless and simple spray pyrolysis technique can be used to prepare such oxides and open the way of possible valorisation of the prepared films in many optoelectronic applications.…”
Section: Resultsmentioning
confidence: 92%
“…Investigation of crystals based on wide band gap II-VI semiconductor compounds [1][2][3][4][5] attract considerable attention as a result of wide applications in lasers and photovoltaic cells production in relation, i.e. with laser television and high quality color printing systems.…”
Section: Introductionmentioning
confidence: 99%
“…The reduction in the lattice constant is the first indicator of the insertion of Yb into the cages of the Pb 1Àx Yb x Se 0.2 Te 0.8 structure, thus changing Pb þ2 ions (radius ¼ 1.2 Å) into smaller Yb þ3 ions (radius ¼ 1.008 Å). A small fraction of the Yb ions (x ¼ 0.015) in the thin film decreased because of the transfer from a magnetic Yb 3þ (4f 13 ) charge state to a non-magnetically active charge state Yb 2þ (4f 14 ), which is usually present in x ¼ 0.03e0.105 [19,20]. The strain of the lattice exhibited the same behavior (Fig.…”
Section: Rietveld Analysis Of X-ray Diffraction Profilesmentioning
confidence: 69%